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Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…

Instrumentation and Detectors · Physics 2021-09-07 L Schwab , P Allain , N Mauran , X Dollat , L Mazenq , D Lagrange , M Gély , S Hentz , G Jourdan , I Favero , B Legrand

High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…

Mesoscale and Nanoscale Physics · Physics 2014-03-11 C. Doolin , P. H. Kim , B. D. Hauer , A. J. R MacDonald , J. P Davis

Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…

Mesoscale and Nanoscale Physics · Physics 2017-05-25 Alessandro Siria , Antoine Niguès

Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…

Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…

Mesoscale and Nanoscale Physics · Physics 2013-12-11 Fengzhen Zhang , Othmar Marti , Stefan Walheim , Thomas Schimmel

Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…

We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

Optics · Physics 2015-06-05 Yuxiang Liu , Houxun Miao , Vladimir Aksyuk , Kartik Srinivasan

Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…

Quantum Physics · Physics 2017-03-08 Ravid Shaniv , Roee Ozeri

Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…

Instrumentation and Detectors · Physics 2025-06-10 Simon Laflamme , Bugrahan Guner , Omur E. Dagdeviren

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…

Applications · Statistics 2017-06-28 Bryan Yates , Aleksander Labuda , Martin Lysy

Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…

Applied Physics · Physics 2024-11-26 Kenichi Umeda , Noriyuki Kodera

Opto-mechano-fluidic resonators (OMFRs) are a unique optofluidics platform that can measure the acoustic properties of fluids and bioanalytes in a fully-contained microfluidic system. By confining light in ultra-high-Q whispering gallery…

Optics · Physics 2014-05-22 Kaiyuan Zhu , Kewen Han , Tal Carmon , Xudong Fan , Gaurav Bahl

Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…

Materials Science · Physics 2016-10-12 Nina Balke , Stephen Jesse , Pu Yu , Ben Carmichael , Sergei V. Kalinin , Alexander Tselev

Mechanical resonators are widely used as inertial balances to detect small quantities of adsorbed mass through shifts in oscillation frequency[1]. Advances in lithography and materials synthesis have enabled the fabrication of nanoscale…

Materials Science · Physics 2015-05-13 K. Jensen , Kwanpyo Kim , A. Zettl

It has been demonstrated in the recent years that nanomechanical mass spectrometry was well suited for the analysis of specific high mass species such as viruses. Still, the exclusive use of one-dimensional devices such as vibrating beams…

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…

Mesoscale and Nanoscale Physics · Physics 2017-02-01 Nina Balke , Stephen Jesse , Ben Carmichael , M. Baris Okatan , Ivan I. Kravchenko , Sergei V. Kalinin , Alexander Tselev

Operation of nanomechanical devices in water environment has been challenging due to the strong viscous damping that greatly impedes the mechanical motion. Here we demonstrate an optomechanical micro-wheel resonator integrated in…

Optics · Physics 2015-08-12 King Yan Fong , Menno Poot , Hong X. Tang

Opto-mechano-fluidic resonators (OMFRs) are a new platform for high-throughput sensing of the mechanical properties of freely flowing microparticles in arbitrary media. Experimental extraction of OMFR mode shapes, especially the acoustic…

Optics · Physics 2018-03-14 Jeewon Suh , Kewen Han , Gaurav Bahl

Low-loss transmission and sensitive recovery of weak radio-frequency (rf) and microwave signals is an ubiquitous technological challenge, crucial in fields as diverse as radio astronomy, medical imaging, navigation and communication,…

The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…

Applied Physics · Physics 2025-11-25 Le Tri Dat , Nguyen Duy Vy
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