Related papers: Steady-state and transient behavior in dynamic ato…
It is generally thought that capillary interactions in nanoscale contacts give rise to unwanted behaviour due to high adhesion. We show that this is not the case for sufficiently small contacts in ambient conditions. High resolution ambient…
We study the velocity dependence of the frictional force of the tip of an atomic force microscope as it is dragged across a surface, taking into account memory effects and thermal fluctuations. Memory effects are described by a coupling of…
Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising from system noise, a deep understanding of MDF is essential…
In a previous work, we designed a compact atom interferometer to measure homogeneous constant forces guiding the arms via shortcuts to adiabatic paths. Within this scheme we drive the atom by moving spin-dependent traps, and design a force…
The characteristic tip_substrate capacitance is crucial for understanding the localized electrical properties in atomic force microscopy (AFM). Since it is highly dependent on tip geometrical features, estimation of the tip_substrate…
This paper presents results about fabrication and operation of electrostatic actuators in liquids with various permittivities. In the static mode, we provide experimental and theoretical demonstration that the pull-in effect can be shifted…
We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
We investigate the transient effects occurring in a molecular quantum dot described by an Anderson-Holstein Hamiltonian which is instantly coupled to two fermionic leads biased by a finite voltage. In the limit of weak electron-phonon…
The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting samples, have stimulated theoretical attempts to explain such…
We show that the static force spectroscopy curve is significantly modified due to presence of intrinsic cantilever instability. This instability acts in tandem with such instabilities like water bridge or molecular bond rupture and makes…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…
The aim of this work is to study the dynamics and stability of soft shape-morphing configurations and specifically the modes of interaction between the front and rear airfoil segments. Initially we present several steady-state solutions,…
A theoretical model is developed that can accurately analyze the effects of thermal fluctuations in antiferromagnetic (AFM) nano-particles. The approach is based on Fourier series representation of the random effective field with cut-off…
While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not…