Related papers: Gazing at crystal balls: Electron backscatter diff…
Recovering a function from its spherical Radon transform with centers of spheres of integration restricted to a hypersurface is at the heart of several modern imaging technologies, including SAR, ultrasound imaging, and photo- and…
Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…
Very short pulses of x-ray free-electron lasers opened the way to obtain diffraction signal from single particles beyond the radiation dose limit. For 3D structure reconstruction many patterns are recorded in the object's unknown…
The routine and unique determination of minor phases in microstructures is critical to materials science. In metallurgy alone, applications include alloy and process development and the understanding of degradation in service. We develop a…
The phenomena of electron, neutron, atomic and molecular diffraction have been studied by many experiments, and these experiments are explained by some theoretical works. In this paper, we study electronic double-slit diffraction with…
The electron optics of a 90 degree spherical deflecting analyzer (SDA-90) is investigated with an imaging matrix formalism. As a preanalyzer in the UTA-neutrino experiment, high transmission and reasonable energy resolution are the choices…
Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…
In this article, a novel analytical approach is presented for the analysis of electromagnetic (EM) scattering from radially inhomogeneous spherical structures (RISSs) based on the duality principle. According to the spherical symmetry,…
Serial electron diffraction (SerialED) is an emerging technique, which applies the snapshot data-collection mode of serial X-ray crystallography to three-dimensional electron diffraction (3D ED), forgoing the conventional rotation method.…
Resolving pseudosymmetry has long presented a challenge for electron backscatter diffraction (EBSD) and has been notoriously challenging in the case of tetragonal ZrO2 in particular. In this work, a method is proposed to resolve…
In this tutorial paper, we consider the problem of electromagnetic scattering by a bounded two-dimensional dielectric object, and discuss certain interesting properties of the scattered field. Using the electric field integral equation,…
The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…
Use of electron vortex beams (EVB), that is convergent electron beams carrying an orbital angular momentum (OAM), is a novel development in the field of transmission electron microscopy. They should allow measurement of element-specific…
We consider the elastic scattering of electrons by hydrogen atoms in the presence of a two-color circularly polarized laser field in the domain of moderate intensities below $10^{13}$ W/cm$^2$ and high projectile energies. A hybrid approach…
Accurately indexing pseudosymmetric materials has long proven challenging for electron backscatter diffraction. The recent emergence of intensity-based indexing approaches promises an enhanced ability to resolve pseudosymmetry compared to…
Precession Electron Diffraction (PED) offers a number of advantages for crystal structure analysis and solving unknown structures using electron diffraction. The current article uses many-beam simulations of PED intensities, in combination…
The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…
Electron Backscattering Diffraction (EBSD) provides important information to discriminate phase transformation products in steels. This task is conventionally performed by an expert, who carries a high degree of subjectivity and requires…
The electron structure function method is applied to calculate model-independent radiative corrections to an asymmetry of electron-proton scattering. The representations for both spin-independent and spin-dependent parts of the…
The use of highly sensitive pixelated direct detectors has dramatically improved the performance of high energy instrumentation such as transmission electron microscopy. Here, we describe a recently developed monolithic active pixel sensor…