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The increasing use of two-dimensional (2D) materials in nanoelectronics demands robust metrology techniques for electrical characterization, especially for large-scale production. While atomic force microscopy (AFM) techniques like…

Computer Vision and Pattern Recognition · Computer Science 2026-02-03 Levi Harris , Md Jayed Hossain , Mufan Qiu , Ruichen Zhang , Pingchuan Ma , Tianlong Chen , Jiaqi Gu , Seth Ariel Tongay , Umberto Celano

In this work, we propose a novel unsupervised deep learning model to address multi-focus image fusion problem. First, we train an encoder-decoder network in unsupervised manner to acquire deep feature of input images. And then we utilize…

Computer Vision and Pattern Recognition · Computer Science 2020-09-25 Boyuan Ma , Xiaojuan Ban , Haiyou Huang , Yu Zhu

Deep learning-based methods have shown remarkable success for various image restoration tasks such as denoising and deblurring. The current state-of-the-art networks are relatively deep and utilize (variants of) self attention mechanisms.…

Computer Vision and Pattern Recognition · Computer Science 2024-04-02 Youssef Mansour , Reinhard Heckel

An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…

Mesoscale and Nanoscale Physics · Physics 2019-12-10 Ramazan Sahin , Mehmet Gunay , Alpan Bek , Mehmet Emre Tasgin

Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…

Materials Science · Physics 2018-05-07 Oleg K. Garishin , Roman I. Izyumov , Alexander L. Svistkov

This paper presents a new algorithm, Accelerated Wirtinger Flow (AWF), for ptychographic image reconstruction from phaseless diffraction pattern measurements. AWF is based on combining Nesterov's acceleration approach with Wirtinger…

Image and Video Processing · Electrical Eng. & Systems 2018-06-29 Rui Xu , Mahdi Soltanolkotabi , Justin P. Haldar , Walter Unglaub , Joshua Zusman , Anthony F. J. Levi , Richard M. Leahy

Purpose: Off-resonance artifact correction by deep-learning, to facilitate rapid pediatric body imaging with a scan time efficient 3D cones trajectory. Methods: A residual convolutional neural network to correct off-resonance artifacts…

Computer Vision and Pattern Recognition · Computer Science 2018-10-04 David Y Zeng , Jamil Shaikh , Dwight G Nishimura , Shreyas S Vasanawala , Joseph Y Cheng

Applying standard algorithms to sparse data problems in photoacoustic tomography (PAT) yields low-quality images containing severe under-sampling artifacts. To some extent, these artifacts can be reduced by iterative image reconstruction…

Numerical Analysis · Mathematics 2024-12-20 Stephan Antholzer , Johannes Schwab , Robert Nuster , Markus Haltmeier

Electroencephalographic signals are represented as multidimensional datasets. We introduce an enhancement to the augmented covariance method (ACM), exploiting more thoroughly its mathematical properties, in order to improve motor imagery…

Signal Processing · Electrical Eng. & Systems 2024-06-26 Igor Carrara , Theodore Papadopoulo

Deep learning methods have played a more and more important role in hyperspectral image classification. However, the general deep learning methods mainly take advantage of the information of sample itself or the pairwise information between…

Computer Vision and Pattern Recognition · Computer Science 2021-03-30 Zhiqiang Gong , Weidong Hu , Xiaoyong Du , Ping Zhong , Panhe Hu

Depth information plays a crucial role in autonomous systems for environmental perception and robot state estimation. With the rapid development of deep neural network technology, depth estimation has been extensively studied and shown…

Robotics · Computer Science 2024-11-11 Quang Truong Nguyen , Thanh Nguyen Canh , Xiem HoangVan

Purpose: To develop a pipeline for motion artifact correction in mGRE and quantitative susceptibility mapping (QSM). Methods: Deep learning is integrated with autofocus to improve motion artifact suppression, which is applied QSM of…

Signal Processing · Electrical Eng. & Systems 2024-05-28 Chao Li , Jinwei Zhang , Hang Zhang , Jiahao Li , Pascal Spincemaille , Thanh D. Nguyen , Yi Wang

Deconvolution is the most commonly used image processing method to remove the blur caused by the point-spread-function (PSF) in optical imaging systems. While this method has been successful in deblurring, it suffers from several…

Image and Video Processing · Electrical Eng. & Systems 2019-10-10 Huangxuan Zhao , Ziwen Ke , Ningbo Chen , Ke Li , Lidai Wang , Xiaojing Gong , Wei Zheng , Liang Song , Zhicheng Liu , Dong Liang , Chengbo Liu

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…

Applications · Statistics 2017-06-28 Bryan Yates , Aleksander Labuda , Martin Lysy

Infrared and visible image fusion, as a hot topic in image processing and image enhancement, aims to produce fused images retaining the detail texture information in visible images and the thermal radiation information in infrared images. A…

Image and Video Processing · Electrical Eng. & Systems 2021-04-15 Zixiang Zhao , Jiangshe Zhang , Shuang Xu , Kai Sun , Chunxia Zhang , Junmin Liu

Non--Contact Atomic Force Microscopy with CO--functionalized metal tips (referred to as HR-AFM) provides access to the internal structure of individual molecules adsorbed on a surface with totally unprecedented resolution. Previous works…

Deep complex-valued neural networks (CVNNs) provide a powerful way to leverage complex number operations and representations and have succeeded in several phase-based applications. However, previous networks have not fully explored the…

Image and Video Processing · Electrical Eng. & Systems 2025-03-06 Yanting Yang , Yiren Zhang , Zongyu Li , Jeffery Siyuan Tian , Matthieu Dagommer , Jia Guo

Electron tomography, as an important 3D imaging method, offers a powerful method to probe the 3D structure of materials from the nano- to the atomic-scale. However, as a grant challenge, radiation intolerance of the nanoscale samples and…

Materials Science · Physics 2020-03-30 Chunyang Wang , Guanglei Ding , Yitong Liu , Huolin L. Xin

Quality of image always plays a vital role in in-creasing object recognition or classification rate. A good quality image gives better recognition or classification rate than any unprocessed noisy images. It is more difficult to extract…

Computer Vision and Pattern Recognition · Computer Science 2020-11-16 Md Tanzil Shahriar , Huyue Li

Scanning probe experiments such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on strongly correlated electronic systems often reveal complex pattern formation on multiple length scales. By studying the universal…

Strongly Correlated Electrons · Physics 2019-04-03 L. Burzawa , Shuo Liu , E. W. Carlson