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We investigate the use of Low Energy Ion Scattering (LEIS) to characterize buried interfaces of ultra-thin films. LEIS spectra contain depth-resolved information in the so-called sub-surface signal. However, the exact correlation between…

Materials Science · Physics 2023-06-02 Adele Valpreda , Jacobus M. Sturm , Andrey Yakshin , Marcelo Ackermann

A heterostructure of Ba$_{1-x}$Sr$_x$TiO$_3$/La$_{1.1}$Sr$_{0.9}$NiO$_3$ /SrTiO$_3$ has been analysed by magnetic sector secondary ion mass spectrometry (SIMS). The stoichiometry parameter $x$ of the top layer was made varying continuously…

Materials Science · Physics 2025-03-06 J. Scola , F. Jomard , E. Loire , J. Wolfman , B. Negulescu , G. Z. Liu , M. -A. Pinault-Thaury

Impact collision ion scattering spectroscopy (ICISS), which is a variation of low energy ion scattering (LEIS) that employs large scattering angles, is performed on Bi2Se3 surfaces prepared by ion bombardment and annealing (IBA). ICISS…

Materials Science · Physics 2017-07-24 Weimin Zhou , Haoshan Zhu , Jory A. Yarmoff

We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…

In this study, we investigate the W-on-Si interface and the effect of adding a B4C interlayer at such interface, using low-energy ion scattering (LEIS) spectroscopy, X-ray reflectivity, X-ray diffraction, and transmission electron…

Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite…

Materials Science · Physics 2009-11-13 H. Hibino , H. Kageshima , F. Maeda , M. Nagase , Y. Kobayashi , H. Yamaguchi

The dynamic behaviour of thermally driven segregation of Cr to the surface of WCrY smart alloy is studied with low energy ion scattering (LEIS). Sputtering the WCrY sample with 500 eV D$_2^+$ ions at room temperature results in preferential…

Materials Science · Physics 2020-07-15 Hans Rudolf Koslowski , Janina Schmitz , Christian Linsmeier

Accessing precisely to the phase variation of electronic wave-packet (EWP) provides unprecedented spatiotemporal information of microworld. A radial interference pattern at near-zero energy has been widely observed in experiments of…

Energy spectra of backscattered and transmitted ions with primary energies of 50 keV and 100 keV interacting with self-supporting foils were recorded with a Time-of-Flight Medium-Energy Ion Scattering setup in a single experiment.…

Materials Science · Physics 2021-02-24 Barbara Bruckner , Philipp M. Wolf , Peter Bauer , Daniel Primetzhofer

Compositionally complex solid solutions (CCSSs) consist of a randomly mixed single phase with the potential to enhance electrocatalytic activity through their polyelemental surface atom arrangements. However, microstructural complexity…

This study aims towards a systematic reciprocity of the tunable synthesis parameters - partial pressure of N$_2$ gas, ion energy (\Ei) and Ti interface in TiN thin film samples deposited using ion beam sputtering at ambient temperature…

Materials Science · Physics 2020-06-22 Susmita Chowdhury , Rachana Gupta , Shashi Prakash , Layanta Behera , D. M. Phase , Mukul Gupta

We have investigated the effects of low-energy ion beam irradiations using argon clusters on the chemical and electronic properties of LaAlO3/SrTiO3 (LAO/STO) heterointerfaces by combining X-ray photoelectron spectroscopy (XPS) and…

Strongly Correlated Electrons · Physics 2018-01-24 Karl Ridier , Damien Aureau , Bruno Bérini , Yves Dumont , Niels Keller , Jackie Vigneron , Arnaud Etcheberry , Arnaud Fouchet

Arranged patterns obtained by ultrafast laser processing on the surface of Ti/Cu/Ti/Si and Ti/Zr/Ti/Si thin film systems are reported. Two differently designed multilayer thin films, Ti/Cu/Ti/Si and Ti/Zr/Ti/Si, were deposited on silicon by…

Performing an analysis within density functional theory, we develop insight into the structural and electronic properties of the oxide heterostructure LaAlO3/SrTiO3. Electrostatic surface effects are decomposed from the internal lattice…

Materials Science · Physics 2015-05-13 U. Schwingenschloegl , C. Schuster

Hydrogenated amorphous carbon thin films (a:C-H) are very promising materials for numerous applications. The growing of relevance of a:C-H is mainly due to the long-term stability of their outstanding properties. For improving their…

Materials Science · Physics 2025-01-22 L. Lajaunie , C. Pardanaud , C. Martin , P. Puech , C. Hu , M. J. Biggs , R. Arenal

Time-dependent and constituent-specific spectral changes in soft near edge X-ray spectroscopy (XAS) of an [Fe/MgO]$_8$ metal/insulator heterostructure upon laser excitation are analyzed at the O K-edge with picosecond time resolution. The…

We present an ab initio analytic theory to account for both the very low energy structure (VLES) [C. Y. Wu et al., Phys. Rev. Lett. 109, 043001 (2012); W. Quan et al., Phys. Rev. Lett. 103, 093001 (2009)], and the low energy structure (LES)…

Atomic Physics · Physics 2015-06-10 Atef S. Titi , Gordon W. F. Drake

Metal - organic nanocomposite thin films represent a versatile class of materials whose properties can be effectively tuned through external stimuli. In this study, Ag+C60 and Au+C60 nanocomposite thin films were briefly investigated to…

A simple model to describe Mixed Ionic Electronic Conductors (MIEC) in terms of standard semiconductor physics is described. This model allows to understand defect equilibrium and charge transport at ideal heterojunctions between materials…

Materials Science · Physics 2013-07-26 J. Roqueta , A. Apostolidis , J. Chaigneau , R. Moreno , J. Zapata , M. Burriel , J. Santiso

The oxidation of the Ni(111) surface is studied experimentally with low energy electron microscopy and theoretically by calculating the electron reflectivity for realistic models of the NiO/Ni(111) surface with an ab-initio scattering…

Mesoscale and Nanoscale Physics · Physics 2012-03-08 J. Ingo Flege , Axel Meyer , Jens Falta , Eugene E. Krasovskii
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