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Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
Recovering a signal from its Fourier intensity underlies many important applications, including lensless imaging and imaging through scattering media. Conventional algorithms for retrieving the phase suffer when noise is present but display…
Atomic resolution electron microscopy, particularly high-angle annular dark-field scanning transmission electron microscopy, has become an essential tool for many scientific fields, when direct visualization of atomic arrangements and…
With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moir\'e patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well…
Ptychography is a popular imaging technique that combines diffractive imaging with scanning microscopy. The technique consists of a coherent beam that is scanned across an object in a series of overlapping positions, leading to reliable and…
Largely due to their implicit nature, neural fields lack a direct mechanism for filtering, as Fourier analysis from discrete signal processing is not directly applicable to these representations. Effective filtering of neural fields is…
Achieving high spatial resolution is the goal of many imaging systems. Designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task in imaging system design. On the other hand,…
Differential Dynamic Microscopy (DDM) is the combination of optical microscopy to statistical analysis to obtain information about the dynamical behaviour of a variety of samples spanning from soft matter physics to biology. In DDM, the…
Optimizing modulation and detection strategies for a given channel is critical to maximize the throughput of a communication system. Such an optimization can be easily carried out analytically for channels that admit closed-form analytical…
We propose approaches based on deep learning to localize objects in images when only a small training dataset is available and the images have low quality. That applies to many problems in medical image processing, and in particular to the…
This paper presents a novel approach on solving the phase problem in nuclear magnetic resonance (NMR) diffusion pore imaging, a method, which allows imaging the shape of arbitrary closed pores filled with an NMR-detectable medium for…
While deep learning has seen many recent applications to drug discovery, most have focused on predicting activity or toxicity directly from chemical structure. Phenotypic changes exhibited in cellular images are also indications of the…
Fast scanning probe microscopy enabled via machine learning allows for a broad range of nanoscale, temporally resolved physics to be uncovered. However, such examples for functional imaging are few in number. Here, using piezoresponse force…
Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system performance beyond the limit defined by its optical elements. The FPM technique applies a novel…
Texture is an essential information in image representation, capturing patterns and structures. As a result, texture plays a crucial role in the manufacturing industry and is extensively studied in the fields of computer vision and pattern…
The trade-off between throughput and image quality is an inherent challenge in microscopy. To improve throughput, compressive imaging under-samples image signals; the images are then computationally reconstructed by solving a regularized…
Quantum Diamond Microscopy using Nitrogen-Vacancy (NV) defects in diamond crystals has enabled the magnetic field imaging of a wide variety of nanoscale current profiles. Intimately linked with the imaging process is the problem of…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge filter placed at the back focal plane of the objective.…
Fourier ptychographic microscopy enables gigapixel-scale imaging, with both large field-of-view and high resolution. Using a set of low-resolution images that are recorded under varying illumination angles, the goal is to computationally…