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Nanoscale materials usually can trap light and strongly interact with it leading to many photonic device applications. The light-matter interactions are commonly probed by optical spectroscopy, which, however, have some limitations such as…

Mesoscale and Nanoscale Physics · Physics 2022-08-24 Jinlong Du , Jin-hui Chen , Yuehui Li , Ruochen Shi , Mei Wu , Yun-Feng Xiao , Peng Gao

The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling contrast imaging (ECCI), and electron back scatter diffraction (EBSD) are reviewed. The dynamical diffraction…

Materials Science · Physics 2019-04-12 AJ Wilkinson , PB Hirsch

While $Hf_{0.5}Zr_{0.5}O_2$ (HZO) thin films hold significant promise for modern nanoelectronic devices, a comprehensive understanding of the interplay between their polycrystalline structure and electrical properties remains elusive. Here,…

Materials Science · Physics 2025-01-10 Kévin Alhada-Lahbabi , Brice Gautier , Damien Deleruyelle , Grégoire Magagnin

Proposals to determine biomolecular structures from diffraction experiments using femtosecond X-ray free-electron laser (XFEL) pulses involve a conflict between the incident brightness required to achieve diffraction-limited atomic…

Optics · Physics 2015-05-19 Harry M. Quiney , Keith A. Nugent

Plan-view transmission electron microscopy (TEM) samples are key to understand the atomic structure and associated properties of materials along their growth orientation, especially for thin films that are stain-engineered onto different…

Applied Physics · Physics 2024-01-08 Supriya Ghosh , Fengdeng Liu , Sreejith Nair , Bharat Jalan , K. Andre Mkhoyan

Micrometric domains of precise ferroelectric polarization have been written into a 20 nm thick epitaxial thin film of BaTiO3(001) (BTO) on a Nb doped SrTiO3 (STO) substrate using PiezoForce Microscopy (PFM). The domain dependent electronic…

Materials Science · Physics 2018-06-06 N. Barrett , J. Rault , I. Krug , B. Vilquin , G. Niu , B. Gautier , D. Albertini , O. Renault

As the continual experimental advances made in Electron energy loss spectroscopy (EELS) and cathodoluminescence (CL) open the door to practical exploitations of plasmonic effects in metal nanoparticles, there is an increasing need for…

Mesoscale and Nanoscale Physics · Physics 2016-05-31 Yu Luo , Matthias Kraft , J. B. Pendry

Angle-resolved photoemission spectroscopy (ARPES), an experimental technique based on the photoelectric effect, is arguably the most powerful method for probing the electronic structure of solids. The past decade has witnessed notable…

Materials Science · Physics 2021-06-21 Baiqing Lv , Tian Qian , Hong Ding

Electron energy-loss spectroscopy (EELS) is a powerful tool for imaging chemical variations at the nanoscale. Here, we investigate a polymer/organic small molecule-blend used as absorber layer in an organic solar cell and employ EELS for…

Surprising asymmetry in the local electromechanical response across a single antiparallel ferroelectric domain wall is reported. Piezoelectric force microscopy is used to investigate both the in-plane and out-of- plane electromechanical…

Materials Science · Physics 2009-11-11 David A. Scrymgeour , Venkatraman Gopalan

In situ scanning transmission electron microscopy (STEM) through liquids is a promising approach for exploring biological and materials processes. However, options for in situ chemical identification are limited: X-ray analysis is precluded…

Chemical Physics · Physics 2015-06-12 Megan E. Holtz , Yingchao Yu , Jie Gao , Héctor D. Abruña , David A. Muller

The aim of this paper is to deal with multi-physics simulation of micro-electro-mechanical systems (MEMS) based on an advanced numerical methodology. MEMS are very small devices in which electric as well as mechanical and fluid phenomena…

Other Computer Science · Computer Science 2007-11-29 V. Rochus , J. -C. Golinval , C. Louis , C. Mendez , I. Klapka

Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…

Signal Processing · Electrical Eng. & Systems 2026-03-12 Vaibhav Choudhary , Akshay Agarwal , Vivek K Goyal

Low-loss electron energy loss spectroscopy (EELS) has emerged as a technique of choice for exploring the localization of plasmonic phenomena at the nanometer level, necessitating analysis of physical behaviors from 3D spectral data sets.…

Thin film alloys with perpendicular anisotropy were studied using Lorentz Transmission Electron Microscopy (LTEM). This work focuses on the configuration of domain walls and demonstrates the suitability and accuracy of LTEM for the magnetic…

Instrumentation and Detectors · Physics 2009-09-01 Aurélien Masseboeuf , Christophe Gatel , Pascale Bayle-Guillemaud , Alain Marty , Jean-Christophe Toussaint

Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of…

Far-infrared and terahertz spectroscopy of ferroelectric soft and central modes in thin films on substrates is reviewed. In addition to classical displacive proper ferroelectrics, also incipient and relaxor ferroelectrics and multiferroics…

Materials Science · Physics 2016-11-17 Jan Petzelt , Stanislav Kamba

Room temperature coexistence of ferromagnetism and ferroelectricity in a thin film of a novel material of nominal composition PbTi0.5Fe0.5O3-d is probed by standard ferroelectric and ferromagnetic hysteresis loop measurements and by…

Materials Science · Physics 2009-11-11 V. R. Palkar , S. C. Purandare , S. Gohil , J. John , S. Bhattacharya

Correlative light and electron microscopy is a powerful tool to study the internal structure of cells. It combines the mutual benefit of correlating light (LM) and electron (EM) microscopy information. However, the classical approach of…

Computer Vision and Pattern Recognition · Computer Science 2022-08-22 Fengjiao Ma , Rainer Kaufmann , Jaroslaw Sedzicki , Zoltán Cseresnyés , Christoph Dehio , Stephanie Hoeppener , Marc Thilo Figge , Rainer Heintzmann

The recently developed precession electron diffraction (PED) technique in scanning transmission electron microscopy (STEM) has been used to elucidate the local strain distribution and crystalline misorientation in CMOS fabricated strained…