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At advanced process nodes, lithography weakpoints can exist in physical layouts of integrated circuit designs even if the layouts pass design rule checking (DRC). Existence of lithography weakpoints in a physical layout can cause…

Other Computer Science · Computer Science 2018-10-04 I-Lun Tseng , Yongfu Li , Valerio Perez , Vikas Tripathi , Zhao Chuan Lee , Jonathan Yoong Seang Ong

At advanced process nodes, pattern matching techniques have been used in the detection of lithography hotspots, which can affect yields of manufactured integrated circuits. Although commercial pattern matching and in-design hotspot fixing…

Other Computer Science · Computer Science 2018-08-21 I-Lun Tseng , Valerio Perez , Yongfu Li , Zhao Chuan Lee , Vikas Tripathi , Jonathan Yoong Seang Ong

While standard cell layouts are drawn with minimum design rules to maximize the benefit of design area shrinkage, the complicated design rules have caused difficulties with signal routes accessing the pins in standard cell layouts. As a…

Other Computer Science · Computer Science 2018-05-30 Yongfu Li , Wan Chia Ang , Chin Hui Lee , Kok Peng Chua , Yoong Seang Jonathan Ong , Chiu Wing Colin Hui

Continuous technology scaling and the introduction of advanced technology nodes in Integrated Circuit (IC) fabrication is constantly exposing new manufacturability issues. One such issue, stemming from complex interaction between design and…

Machine Learning · Computer Science 2020-07-14 Gaurav Rajavendra Reddy , Constantinos Xanthopoulos , Yiorgos Makris

We address a core problem of computer vision: Detection and description of 2D feature points for image matching. For a long time, hand-crafted designs, like the seminal SIFT algorithm, were unsurpassed in accuracy and efficiency. Recently,…

Computer Vision and Pattern Recognition · Computer Science 2020-03-23 Aritra Bhowmik , Stefan Gumhold , Carsten Rother , Eric Brachmann

Automatic defect detection for 3D printing processes, which shares many characteristics with change detection problems, is a vital step for quality control of 3D printed products. However, there are some critical challenges in the current…

Computer Vision and Pattern Recognition · Computer Science 2023-08-04 Yushuo Niu , Ethan Chadwick , Anson W. K. Ma , Qian Yang

Model-based design offers a promising approach for assisting developers to build reliable and secure cyber-physical systems (CPSs) in a systematic manner. In this methodology, a designer first constructs a model, with mathematically precise…

Systems and Control · Computer Science 2019-02-13 Luan Viet Nguyen , Gautam Mohan , James Weimer , Oleg Sokolsky , Insup Lee , Rajeev Alur

Next-generation integrated nanophotonic device designs leverage advanced optimization techniques such as inverse design and topology optimization which achieve high performance and extreme miniaturization by optimizing a massively complex…

Machine Learning · Computer Science 2023-03-23 Dusan Gostimirovic , Yuri Grinberg , Dan-Xia Xu , Odile Liboiron-Ladouceur

Automated fiber placement (AFP) is an advanced manufacturing technology that increases the rate of production of composite materials. At the same time, the need for adaptable and fast inline control methods of such parts raises. Existing…

Computer Vision and Pattern Recognition · Computer Science 2019-10-14 Sebastian Zambal , Christoph Heindl , Christian Eitzinger , Josef Scharinger

Users around the world rely on software-intensive systems in their day-to-day activities. These systems regularly contain bugs and security vulnerabilities. To facilitate bug fixing, data-driven models of automatic program repair use pairs…

Software Engineering · Computer Science 2022-02-08 Anastasiia Grishina

Inverse problems arise in a multitude of applications, where the goal is to recover a clean signal from noisy and possibly (non)linear observations. The difficulty of a reconstruction problem depends on multiple factors, such as the ground…

Image and Video Processing · Electrical Eng. & Systems 2024-08-21 Zalan Fabian , Berk Tinaz , Mahdi Soltanolkotabi

Efficient and effective on-line detection and correction of bad-pixels can improve yield and increase the expected lifetime of image sensors. This paper presents a comprehensive Deep Learning (DL) based on-line detection and correction…

Image and Video Processing · Electrical Eng. & Systems 2024-07-26 Sreetama Sarkar , Xinan Ye , Gourav Datta , Peter A. Beerel

Nanoindentation is vital for probing mechanical properties, yet traditional grid-based workflows are inefficient for targeting specific microstructural features. We present an automated nanoindentation framework that integrates machine…

Instrumentation and Detectors · Physics 2025-04-28 Vivek Chawla , Dayakar Penumadu , Sergei Kalinin

A long-standing open challenge for automated program repair is the overfitting problem, which is caused by having insufficient or incomplete specifications to validate whether a generated patch is correct or not. Most available repair…

Software Engineering · Computer Science 2021-11-11 Omar I. Al-Bataineh , Anastasiia Grishina , Leon Moonen

Automated program repair techniques, which target to generating correct patches for real world defects automatically, have gained a lot of attention in the last decade. Many different techniques and tools have been proposed and developed.…

Software Engineering · Computer Science 2017-05-15 Jiajun Jiang , Yingfei Xiong

Reliable quantitative analysis of immunohistochemical staining images requires accurate and robust cell detection and classification. Recent weakly-supervised methods usually estimate probability density maps for cell recognition. However,…

Computer Vision and Pattern Recognition · Computer Science 2022-07-04 Zhongyi Shui , Shichuan Zhang , Chenglu Zhu , Bingchuan Wang , Pingyi Chen , Sunyi Zheng , Lin Yang

Properly benchmarking Automated Program Repair (APR) systems should contribute to the development and adoption of the research outputs by practitioners. To that end, the research community must ensure that it reaches significant milestones…

Software Engineering · Computer Science 2019-02-18 Kui Liu , Anil Koyuncu , Tegawendé F. Bissyandé , Dongsun Kim , Jacques Klein , Yves Le Traon

Mapping complex metadata structures is crucial in a number of domains such as data integration, ontology alignment or model management. To speed up that process automatic matching systems were developed to compute mapping suggestions that…

Databases · Computer Science 2011-08-10 Eric Peukert , Julian Eberius , Erhard Rahm

We propose a deep learning approach based on an autoencoder for identifying and localizing fiber faults in passive optical networks. The experimental results show that the proposed method detects faults with 97% accuracy, pinpoints them…

Signal Processing · Electrical Eng. & Systems 2022-03-23 Khouloud Abdelli , Florian Azendorf , Helmut Griesser , Carsten Tropschug , Stephan Pachnicke

Redundancy-based automated program repair (APR), which generates patches by referencing existing source code, has gained much attention since they are effective in repairing real-world bugs with good interpretability. However, since…

Software Engineering · Computer Science 2025-08-27 Jiajun Jiang , Fengjie Li , Zijie Zhao , Zhirui Ye , Mengjiao Liu , Bo Wang , Hongyu Zhang , Junjie Chen
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