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An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…

Mesoscale and Nanoscale Physics · Physics 2019-12-10 Ramazan Sahin , Mehmet Gunay , Alpan Bek , Mehmet Emre Tasgin

In situ Electro-Chemical Scanning Tunneling Microscopy (ECSTM) and Electron Back-Scatter Diffraction analysis of the same local microstructural region were combined to study the relationships between grain boundary (GB) type and structure…

We present a way of treating the problem of the interaction of a single trapped ion with laser beams based on successive aplications of unitary transformations onto the Hamiltonian. This allows the diagonalization of the Hamiltonian, by…

Quantum Physics · Physics 2013-03-13 H. Moya-Cessa , A. Vidiella-Barranco , J. A. Roversi , S. M. Dutra

High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…

Mesoscale and Nanoscale Physics · Physics 2014-08-27 Prokop Hapala , Georgy Kichin , Christian Wagner , F. Stefan Tautz , Ruslan Temirov , Pavel Jelinek

We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…

Chemical Physics · Physics 2016-09-28 Yuval Ebenstein , Eyal Yoskovitz , Ronny Costi , Asaf Aharoni , Uri Banin

Interfaces separating ferromagnetic (FM) layers from non-ferromagnetic layers offer unique properties due to spin-orbit coupling and symmetry breaking, yielding effects such as exchange bias, perpendicular magnetic anisotropy, spin-pumping,…

A low-temperature scanning tunneling microscope was employed to study the differential conductance in an atomic junction formed by an adsorbed Co atom on a Cu(100) surface and a copper-covered tip. A zero-bias anomaly (ZBA) reveals spin…

Mesoscale and Nanoscale Physics · Physics 2018-03-07 Deung-Jang Choi , Paula Abufager , Laurent Limot , Nicolas Lorente

Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…

Applied Physics · Physics 2020-07-31 M. Chighizola , L. Puricelli , L. Bellon , A. Podestà

Precise manipulation of small objects using light holds transformative potential across diverse fields. While research in optical trapping and manipulation predominantly relies on the attraction of solid matter to light intensity maxima,…

Optics · Physics 2025-04-28 Adeel Afridi , Bruno Melo , Nadine Meyer , Romain Quidant

A custom double-lamella method is presented for electrochemically etching tungsten wire for use as tips in scanning tunneling microscopy (STM). For comparison, tips were also manufactured in-house using numerous conventional methods and…

Mesoscale and Nanoscale Physics · Physics 2015-02-06 J. K. Schoelz , P. Xu , S. D. Barber , D. Qi , M. L. Ackerman , G. Basnet , C. T. Cook , P. M. Thibado

Images of a single-electron quantum dot were obtained in the Coulomb blockade regime at liquid He temperatures using a cooled scanning probe microscope (SPM). The charged SPM tip shifts the lowest energy level in the dot and creates a ring…

The tip of a low-temperature scanning tunneling microscope is brought into contact with individual Kondo impurities (cobalt atoms) adsorbed on a Cu(100) surface. A smooth transition from the tunneling regime to a point contact with a…

Strongly Correlated Electrons · Physics 2007-05-23 N. Neel , J. Kroeger , L. Limot , K. Palotas , W. A. Hofer , R. Berndt

In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded…

The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…

Instrumentation and Detectors · Physics 2007-05-23 P. Fraundorf , J. Tentschert

We present a method used to intuitively interpret the STM contrast by investigating individual wave functions originating from the substrate and tip side. We use localized basis orbital density functional theory, and propagate the wave…

Mesoscale and Nanoscale Physics · Physics 2018-09-14 Alexander Gustafsson , Magnus Paulsson

The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…

The magnetic coupling between single Co atoms adsorbed on a copper surface is determined by probing the Kondo resonance using low-temperature scanning tunneling spectroscopy. The Kondo resonance, which is due to magnetic correlation effects…

Strongly Correlated Electrons · Physics 2007-05-23 P. Wahl , P. Simon , L. Diekhoener , V. S. Stepanyuk , P. Bruno , M. A. Schneider , K. Kern

Integrated photonic circuits have transformed data communication, biosensing, and light detection and ranging, and hold wide-ranging potential for optical computing, optical imaging and signal processing. These applications often require…

The intermediate state of type-I superconductors presents a classic paradigm of modulated pattern formation, arising from the competition between short-range attractive and long-range repulsive vortex-vortex interactions. However, direct…

Superconductivity · Physics 2026-04-24 Xin-Sheng Gao , Qun Wang , Ya-Xun He , Xing-Jian Liu , Jun-Han Zhang , Kang-Hong Yin , Jia-Ying Zhang , Jun-Yi Ge

We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of…

Materials Science · Physics 2009-11-13 T. Jungk , A. Hoffmann , E. Soergel