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Related papers: High resolution electron microscopy for heterogene…

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The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…

Applied Physics · Physics 2023-01-26 Leonardo Corrêa , Eduardo Ortega , Arturo Ponce , Mônica Cotta , Daniel Ugarte

We explore the possibility to perform an in-situ transmission electron microscopy (TEM) thermoelectric characterization of materials. A differential heating element on a custom in-situ TEM microchip allows to generate a temperature gradient…

Materials Science · Physics 2025-01-14 Simon Hettler , Mohammad Furqan , Andres Sotelo , Raul Arenal

High energy electron beams can now be routinely focused to 1-2 {\AA} and offer the ability to obtain vibrational information from materials using monochromated electron energy-loss spectroscopy (EELS) in a scanning transmission electron…

Materials Science · Physics 2021-07-13 Kartik Venkatraman , Peter A. Crozier

Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures are described. In addition, recent developments of dynamic real time in situ…

Chemical Physics · Physics 2017-05-17 Pratibha Gai , Edward Boyes

It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been…

Instrumentation and Detectors · Physics 2015-12-29 Wei-Tse Chang , Chun-Yueh Lin , Wei-Hao Hsu , Mu-Tung Chang , Yi-Sheng Chen , En-Te Hwu , Ing-Shouh Hwang

We report a method for fabricating nanogaps directly with electron beam lithography (EBL). The primary resolution-limit of EBL, electron back-scattering, is reduced dramatically by using a thin-film as a substrate. We show that this…

Mesoscale and Nanoscale Physics · Physics 2009-11-11 Michael D. Fischbein , Marija Drndic

Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}),…

Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…

Computer Vision and Pattern Recognition · Computer Science 2025-04-04 Hesong Li , Ziqi Wu , Ruiwen Shao , Tao Zhang , Ying Fu

Single-atom catalysts (SACs), composed of isolated metal atoms dispersed on solid supports, represent the ultimate expression of atomic efficiency in catalysis. Their remarkable activity and selectivity arise from local coordination…

Materials Science · Physics 2026-03-27 Petr Lazar , Michal Otyepka

Two novel (and proprietary) strategies for the structural identification of a nanocrystal from either a single high-resolution (HR) transmission electron microscopy (TEM) image or a single precession electron diffraction pattern are…

Materials Science · Physics 2008-04-02 Peter Moeck

Simultaneously probing the electronic structure and morphology of materials at the nanometer or atomic scale while a chemical reaction proceeds is significant for understanding the underlying reaction mechanisms and optimizing a materials…

Materials Science · Physics 2012-09-11 Huolin L. Xin , Elzbieta A. Pach , Rosa E. Diaz , Eric A. Stach , Miquel Salmeron , Haimei Zheng

Development of cost-effective hydrogen evolution reaction (HER) catalysts with outstanding catalytic activity, replacing cost-prohibitive noble metal-based catalysts, is critical for practical green hydrogen production. A popular strategy…

In situ scanning transmission electron microscopy (STEM) through liquids is a promising approach for exploring biological and materials processes. However, options for in situ chemical identification are limited: X-ray analysis is precluded…

Chemical Physics · Physics 2015-06-12 Megan E. Holtz , Yingchao Yu , Jie Gao , Héctor D. Abruña , David A. Muller

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…

Strong multiple scattering of the probe in scanning transmission electron microscopy (STEM) means image simulations are usually required for quantitative interpretation and analysis of elemental maps produced by electron energy-loss…

Materials Science · Physics 2019-12-25 Hamish G. Brown , Jim Ciston , Colin Ophus

Understanding the interplay between the structure, composition and opto-electronic properties of semiconductor nano-objects requires combining transmission electron microscopy (TEM) based techniques with electrical and optical measurements…

Scanning tunneling microscopy (STM) and micro-electromechanical systems (MEMS) have traditionally addressed vastly different length scales - one resolving atoms, the other engineering macroscopic motion. Here we unite these two fields to…

Mesoscale and Nanoscale Physics · Physics 2026-01-09 R. J. G. Elbertse , M. Xu , A. Keşkekler , S. Otte , R. A. Norte

Momentum-resolved scanning transmission electron microscopy (MRSTEM) is a powerful phase-contrast technique that can map lateral magnetic and electric fields ranging from the micrometer to the subatomic scale. Resolving fields ranging from…

A metal oxide support and a catalytically active metal are the two main ingredients for complex catalysts used in heterogeneous catalysis. The gas environment can change the catalyst during the reaction, modifying its structural and…

The Rayleigh limit has so far applied to all microscopy techniques that rely on linear optical interaction and detection in the far field. Here we demonstrate that detecting the light emitted by an object in higher-order transverse…