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Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
Accurate modelling of the effective point spread function (ePSF) is essential for high-precision photometry and astrometry, particularly in undersampled imaging regimes. In this work, we build on a well-established ePSF modelling framework…
Electron Emission Channeling (EC) is a powerful technique for the investigation of the lattice location of radioactive isotopes implanted into single crystals. After implantation the isotopes occupy certain lattice locations in the crystal,…
Dielectric tensor tomography is an imaging technique for mapping three-dimensional distributions of dielectric properties in transparent materials. This work introduces an enhanced illumination strategy employing a micro-electromechanical…
Materials performance is deeply linked to their microstructures, which govern key properties such as strength, durability, and fatigue resistance. EBSD is a major technique for characterizing these microstructures, but acquiring large and…
Optimizing the performance of organic solar cells (OSCs) hinges on a comprehensive understanding of their nanostructures, yet traditional characterization methods often fall short, delivering incomplete structural snapshots. We introduce…
A Python program for calculating the metrics necessary to perform information-theory based symmetry classifications and quantifications of transmission electron diffraction spot patterns is introduced. It is the first of its kind, in that…
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each point of a raster scan of a focused electron beam across the…
Extracting information from complex data is a challenge shared by multiple frontiers of modern astrophysical research. Among those, analyzing spectra cubes, where the emission is mapped in the position-position-velocity space is a difficult…
Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored…
Two inverse scattering schemes were recently developed in \cite{LiLiuShangSun} for locating multiple electromagnetic (EM) scatterers, respectively, of small size and regular size compared to the detecting EM wavelength. Both schemes make…
STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a programmable scan engine that allows to arbitrarily set the…
Strain engineering is used to obtain desirable materials properties in a range of modern technologies. Direct nanoscale measurement of the three-dimensional strain tensor field within these materials has however been limited by a lack of…
Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single…
Up to 150000 asteroids will be visible in the images of the ESA Euclid space telescope, and the instruments of Euclid offer multiband visual to near-infrared photometry and slitless spectra of these objects. Most asteroids will appear as…
Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…
By using scattering in near field techniques, a microscope can be easily turned into a device measuring static and dynamic light scattering, very useful for the characterization of nanoparticle dispersions. Up to now, microscopy based…
Accurate measurement of light wavelength is critical for applications in spectroscopy, optical communication, and semiconductor manufacturing, ensuring precision and consistency of sensing, high-speed data transmission and device…
In this paper we present a novel method to identify and characterize stellar clusters deeply embedded in a dark molecular cloud. The method is based on measuring stellar surface density in wide-field infrared images using star counting…
Backscatter limits many interferometric measurements, including gravitational wave detectors, by creating spurious interference. We describe an experimental method to directly and quantitatively measure the backscatter interference. We…