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Related papers: Holographic Traction Force Microscopy

200 papers

A high sensitivity force sensor based on dielectric microspheres in vacuum, optically trapped by a single, upward-propagating laser beam, is described. Off-axis parabolic mirrors are used both to focus the 1064~nm trapping beam and to…

Instrumentation and Detectors · Physics 2020-09-10 Akio Kawasaki , Alexander Fieguth , Nadav Priel , Charles P. Blakemore , Denzal Martin , Giorgio Gratta

Underlying the rapidly increasing photovoltaic efficiency and stability of metal halide perovskites (MHPs) is the advance in the understanding of the microstructure of polycrystalline MHP thin film. Over the past decade, intense efforts…

High-speed atomic force microscopy (HS-AFM) is an indispensable technique in the biological field owing to its excellent imaging capability for the real-time observation of biomolecules with high spatial resolution. Furthermore, recent…

Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…

We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane,…

Biological Physics · Physics 2007-05-23 T. Berdyyeva , C. D. Woodworth , I. Sokolov

Coarse-grained, metallic materials undergo microstructure refinement during tribological loading. This in turn results in changing tribological properties, so understanding deformation under tribological load is mandatory when designing…

We present a simple method for accessing the elastic properties of microscopic deformable particles. This method is based on measuring the pressure-induced deformation of soft particles as they are forced through a tapered glass…

Soft Condensed Matter · Physics 2012-09-04 Hans M. Wyss , Thomas Franke , Elisa Mele , David A. Weitz

Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…

Materials Science · Physics 2026-03-05 A. Benhadjira , C. Detlefs , S. Borgi , V. Favre-Nicolin , C. Yildirim

How far a particle moves along the optical axis in a holographic optical trap is not simply dictated by the programmed motion of the trap, but rather depends on an interplay of the trap's changing shape and the particle's material…

Soft Condensed Matter · Physics 2019-10-02 Michael J. O'Brien , David G. Grier

A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented…

Mesoscale and Nanoscale Physics · Physics 2025-03-25 Joel Lefever , Aleksander Labuda , Roger Proksch

Atomic Force Microscope images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image…

Classical Physics · Physics 2015-05-18 Kun Han , Matteo Ciccotti , Stéphane Roux

Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase…

Optics · Physics 2021-12-30 Chuanjian Zheng , Shaohui Zhang , Guocheng Zhou , Yao Hu , Qun Hao

We report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory…

Applied Physics · Physics 2018-04-05 Xiaoyu Wu , Zhenqi Hao , Di Wu , Lu Zheng , Zhanzhi Jiang , Vishal Ganesan , Yayu Wang , Keji Lai

Optical tweezers can manipulate tiny particles. However, the distortion caused by the scattering medium restricts the applications of optical tweezers. Wavefront shaping techniques including the transmission matrix (TM) method are powerful…

Optics · Physics 2022-01-17 Kaige Liu , Hengkang Zhang , Shanshan Du , Zeqi Liu , Bin Zhang , Xing Fu , Qiang Liu

A novel method for measuring the surface coverage of randomly distributed cylindrical nanoparticles such as nanorods and nanowires, using atomic force microscopy (AFM), is presented. The method offers several advantages over existing…

Materials Science · Physics 2018-07-12 Francesca Bottacchi , Stefano Bottacchi , Thomas D. Anthopoulos

In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral…

Materials Science · Physics 2007-05-23 A. C. Papageorgopoulos , H. Wang , C. Guerrero , N. Garcia

Imaging of surface adsorbed molecules is investigated as a novel detection method for matter wave interferometry with fluorescent particles. Mechanically magnified fluorescence imaging turns out to be an excellent tool for recording quantum…

Quantum Physics · Physics 2009-11-13 Alexander Stibor , Andre Stefanov , Fabienne Goldfarb , Elisabeth Reiger , Markus Arndt

Dynamic force spectroscopy (DFS) is an experimental technique that is commonly used to assess information of the strength, energy landscape, and lifetime of noncovalent bio-molecular interactions. DFS traditionally requires an applied force…

Biological Physics · Physics 2016-07-04 Oscar Björnham , Magnus Andersson

Off-axis electron holography was used to observe and quantify the magnetic microstructure of a perpendicular magnetic anisotropic (PMA) recording media. Thin foils of PMA materials exhibit an interesting up and down domain configuration.…

Materials Science · Physics 2009-10-08 Aurélien Masseboeuf , A. Marty , Pascale Bayle-Guillemaud , Christophe Gatel , E. Snoeck

Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…

Applied Physics · Physics 2024-01-17 Luca Quaroni