Related papers: Nanofabricated tips for device-based scanning tunn…
We present an alternative switching-magnetization magnetic force microscopy (SM- MFM) method using planar tip-on-chip probes. Unlike traditional needle-like tips, the planar probe approach integrates a microdevice near the tip apex with…
Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high-field sensitivity with nanometer-scale spatial resolution. State-of-the-art SQUID-on-tip probes are now playing an…
We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without hardware changes. The resulting setup allows flexible in situ contacting of samples…
We developed a process to fabricate nanoscale metallic gate electrodes on scanning probe cantilevers, including on the irregular surface of protruding cantilever tips. The process includes a floating-layer technique to coat the cantilevers…
The spin-polarized scanning tunnelling microscope (STM) can in principle resolve not only the electronic, but also the magnetic surface structure. We model recent STM measurements achieving magnetic resolution on the atomic scale by a…
We evaluate the realization of a novel geometry of a guided atom interferometer based on a high temperature superconducting microstructure. The interferometer type structure is obtained with a guiding potential realized by two current…
A multiple-tip ultra-high vacuum (UHV) scanning tunneling microscope (MT-STM) with a scanning electron microscope (SEM) for imaging and molecular-beam epitaxy growth capabilities has been developed. This instrument (nanoworkbench) is used…
We present Scanning Tunneling Spectroscopy measurements at 0.1 K using tips made of Al. At zero field, the atomic lattice and charge density wave of 2HNbSe2 are observed, and under magnetic fields the peculiar electronic surface properties…
Scanning tunneling microscopy (STM) has made tremendous progress in the study and understanding of both classical and unconventional superconductors. This has motivated a rapidly growing effort to apply the same techniques to the iron-based…
We present the fabrication of nanoscale superconducting quantum interference devices (SQUIDs) at the apex of wireframe tips on self-aligned superconducting cantilever probes. The probes are made on silicon wafers using molding techniques in…
We review our recent developments of near-field scanning optical microscopy (NSOM) that uses an active tip made of a single fluorescent nanodiamond (ND) grafted onto the apex of a substrate fiber tip. The ND hosting a limited number of…
Near-field optical microscopy and spectroscopy provide high-resolution imaging below the diffraction limit, crucial in physics, chemistry, and biology for studying molecules, nanoparticles, and viruses. These techniques use a sharp metallic…
The problem of an accurate tip radius and shape characterization is very important for determination of surface mechanical and chemical properties on the basis of the scanning probe microscopy measurements. We think that the most favorable…
Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM). Depending on the probe potential, SIM can be performed in both invasive and…
Studying nanoscale dynamics is essential for understanding quantum materials and advancing quantum chip manufacturing. Still, it remains a major challenge to measure non-equilibrium properties such as current and dissipation, and their…
We report near-field scanning optical imaging with an active tip made of a single fluorescent CdSe nanocrystal attached at the apex of an optical tip. Although the images are acquired only partially because of the random blinking of the…
Scanning Tunneling Microscopy (STM) has revolutionized our atomic scale understanding of surfaces and accelerated progress in nanotechnology. This technique, however, is restricted to metal or semiconducting samples, as it requires a tiny…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
A home made DSP-controlled scanning probe microscope (SPM) system has been developed and its utilization as a tool for lithography on nanometer scale is reported. User-friendly graphic interface allows to directly perform nanolithography…
We show that a scanning capacitance microscope (SCM) can image buried delta-doped donor nanostructures fabricated in Si via a recently developed atomic-precision scanning tunneling microscopy (STM) lithography technique. A critical…