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Interatomic-force measurements are regularly performed using frequency-modulation atomic force microscopy. This requires conversion of the observed shift in the resonant frequency of a force-sensing cantilever, to the actual force…
When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing…
A nanoscopy technique that can characterize light-matter interactions with ever increasing spatial resolution and signal-to-noise ratio (SNR) is desired for spectroscopy at molecular levels. Photoinduced force microscopy (PiFM) with…
We present a detailed modeling and characterization of our scalable microwave nanoprobe, which is a micro-fabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis,…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not…
We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…
Atomic Force Microscopy has enabled 2D imaging at the sub-molecular level, and 3D mapping of the potential field. However, fast identification of the surface still remains a challenging topic. In this paper, as a step towards implementation…
An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…
We have realized a microstrip based THz near field cantilever which enables quantitative measurements of the impedance of the probe tip at THz frequencies (0.3 THz). A key feature is the on-chip balanced hybrid coupler which serves as an…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
The complex atomic structures and defects of metal-oxide surfaces are vital for a variety of applications in material science and chemistry. While scanning probe microscopy allows accessing atomic-scale structures in real space, elemental…
We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage…
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components…
Atomic force microscopy using a magnetic tip is a promising tool for investigating conductivity on the nano-scale. By the oscillating magnetic tip eddy currents are induced in the conducting parts of the sample which can be detected in the…
Atomic scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of…
The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits…
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…
Atomic force microscopy (AFM) can be used to characterise several aspects of the surface degradation and reinforcement mechanisms of zirconia based ceramics, such as crack propagation, martensitic relief formation, grains pull-out and…
The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…