Related papers: Resetting Piezoresponse Force Microscopy: Towards …
A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement…
We demonstrate that the method of characterizing viscoelastic materials with Atomic Force Microscopy (AFM) by fitting analytical models to force-distance (FD) curves often yields conflicting and physically unrealistic results. Because this…
While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…
Semiconducting piezoelectric materials have attracted considerable interest due to their central role in the emerging field of piezotronics, where the development of a piezo-potential in response to stress or strain can be used to tune the…
Nano- and micromagnetic materials have been extensively employed in micro-functional devices. However, measuring small-scale mechanical and magnetomechanical properties is challenging, which restricts the design of new products and the…
The functionalization of an Atomic Force Microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be controlled, particularly in force spectroscopy. But some…
We discuss the particle size driven tunability of the coexistence of ferromagnetism and ferroelectricity in Pr0.67Ca0.33MnO3(PCMO) with the help of x ray diffraction, magnetization, impedance spectroscopy, and remanent polarization…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
Powerful mid-infrared illumination combined with mechanical detection via force microscopy provides access to nanoscale spectroscopic imaging in Materials and Life Sciences. Photo-induced force microscopy (PiFM) employs pulsed illumination…
We have studied the dynamics of quartz tuning fork resonators used in atomic force microscopy taking into account mechanical energy dissipation through the attachment of the tuning fork base. We find that the tuning fork resonator quality…
The application of piezoelectric materials, such as Lead Zirconate Titanate (ZrxTi1-x) O3 (PZT) is increasing in multiple dynamic industries such as structural health monitoring, wireless energy harvesting devices, measuring blood flow,…
When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing…
While piezoelectric transduction enables designing acoustic resonators operating at multi-GHz frequencies, the deposition of piezoelectric materials typically requires high temperature processes and specific crystallographic orientation of…
Dynamic spectroscopies in Scanning Probe Microscopy (SPM) are critical for probing material properties, such as force interactions, mechanical properties, polarization switching, and electrochemical reactions and ionic dynamics. However,…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…
We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is…
This paper investigates the deflection of micro- electro-mechanical system (MEMS) based sandwiched cantilever beam for piezoelectric actuation using eight of the popular lead zirconatetitanate (PZT)piezoceramic material. The simulation for…
Efficient mechanical energy harvesting using the principle of piezoelectric effect demands specific material-property requirements. This includes a combination of large piezoelectric charge coefficient (dij), large elastic strain…
We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100…