English
Related papers

Related papers: X-ray diffraction line profile analysis of KBr thi…

200 papers

Two theoretical models for the description of the diffraction properties of gradient crystals have been developed, one in the framework of the kinematic theory, the other within a transfer matrix formalism based on the dynamical theory of…

Materials Science · Physics 2019-01-04 Klaus-Dieter Liss

The equation for the size strain plot methods reported by A. Khorsand Zak et al. (Solid State Sci. 13 (2011), 251) does not follow the dimensional homogeneity, consequently leading to an inaccurate estimation of the crystallite size and…

Materials Science · Physics 2022-11-29 Anand Pal

Micron-thick boron films have been deposited by Pulsed Laser Deposition in vacuum on several substrates at room temperature. The use of high energy pulses (>700 mJ) results in the deposition of smooth coatings with low oxygen uptake even at…

Colloidal quantum dots (QDs) and their thin-films are increasingly used in electronic and photonic devices replacing traditional bulk semiconductors. However, thermal properties of the QDs are comparatively underexplored relative to device…

The calculation of the polarization in ferroelectric thin films is performed using an analytical solution of the Euler-Lagrange differential equation with boundary conditions with different extrapolation lengths of positive sign on the…

Materials Science · Physics 2007-05-23 M. D. Glinchuk , E. A. Eliseev , V. A. Stephanovich , R. Farhi

We modify a theory of flow stress introduced in [arXiv:1803.08247[cond-mat.mtrl-sci]], [arXiv:1809.03628[cond-mat.mes-hall]], [arXiv:1908.09338[cond-mat.mtrl-sci]] for a class of polycrystalline materials with equilibrium and…

Materials Science · Physics 2023-09-18 Alexander A. Reshetnyak , Varvara V. Shamshutdinova

It is shown that the diffraction on a polycrystal can be used for investigation and diagnostics of X-ray radiation emitted in a forward direction by relativistic charged particles moving in crystalline or other targets or fields. Methods…

Instrumentation and Detectors · Physics 2025-03-07 Alexander V. Shchagin

Offering high-brilliance X-ray beams on micrometer length scales, the microfocus-SAXS at SSRF BL16B1 was established with a KB mirror system for studying small sample volumes, or probing micro-scopic morphologies. The SAXS minimum q value…

Instrumentation and Detectors · Physics 2017-01-05 Wenqiang Hua , Yuzhu Wang , Ping Zhou , Tao Hu , Xiuhong Li , Fenggang Bian , Jie Wang

Zirconium based alloys have been irradiated with 11 and 15 MeV proton and 116 MeV oxygen ions at different doses. The changes in the microstructure have been studied for the ion irradiated alloys as a function of dose using X-Ray…

Materials Science · Physics 2009-11-13 A. Sarkar , P. Mukherjee , P. Barat

The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these optoelectronic materials. Using nano-probe diffraction…

We depict the use of x-ray diffraction as a tool to directly probe the strain status in rolled-up semiconductor tubes. By employing continuum elasticity theory and a simple model we are able to simulate quantitatively the strain relaxation…

Materials Science · Physics 2009-11-13 A. Malachias , Ch. Deneke , B. Krause , C. Mocuta , S. Kiravittaya , T. H. Metzger , O. G. Schmidt

Electrons levitating above the surface of solid neon have recently emerged as a promising platform for high-quality qubits. The morphology and uniformity of the neon growth in these systems is crucial for qubit performance in a scalable…

Mesoscale and Nanoscale Physics · Physics 2025-11-19 Kyle Matkovic , Patrick Russell , Andrew Palmer , Eric Helgemo , Lukas Delventhal , Kun Zuo , Kundan Surse , Rajib Rahman , Maja C. Cassidy

We present room temperature ferromagnetic resonance (FMR) studies of polycrystalline ||Pt/10 nm Cu/t Co/10 nm Cu/Pt|| films as a function of Co layer thickness (1 < t < 10 nm) grown by evaporation and magnetron sputtering. FMR was studied…

Materials Science · Physics 2007-07-10 J-M. L. Beaujour , W. Chen , A. D. Kent , J. Z. Sun

The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are…

We study X-ray diffraction in smectic liquid crystal multilayers. Such systems are fabricated as freely suspended films and have a unique layered structure. As such, they can be described as organic Bragg mirrors with sub-nanometer…

Soft Condensed Matter · Physics 2025-10-15 V. V. Samsonov , K. V. Nikolaev , B. I. Ostrovskii , S. N. Yakunin

The stress-strain anisotropy -including both elastic properties and dislocation distributions- of crystalline systems can be studied using a dislocation model proposed by Ung\'ar and Borb\'ely. However this model requires fundamental…

Materials Science · Physics 2017-06-28 Danyel Cavazos-Cavazos , Flavio F. Contreras-Torres

We report the first application of x-rays to the measurement of the temperature dependent Bragg peak intensities to obtain Debye-Waller factors on high-temperature superconductors. Intensities of (0,0,l) peaks of YBa2Cu3O7 and HgBa2CaCu2O6…

Superconductivity · Physics 2009-11-10 C. Kim , A. Mehta , D. L. Feng , K. M. Shen , N. P. Armitage , K. Char , S. H. Moon , Y. Y. Xie , J. Wu

The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's…

In this paper we present a simple and effective numerical method which allows a fast Fourier transformation-based evaluation of stress generated by dislocations with arbitrary directions and Burgers vectors if the (site-dependent)…

Materials Science · Physics 2018-04-06 D. V. Berkov , N. L. Gorn

Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…

Materials Science · Physics 2026-03-05 A. Benhadjira , C. Detlefs , S. Borgi , V. Favre-Nicolin , C. Yildirim