Related papers: Functionalization of atomic force microscopy Akiya…
We report a magnetic imaging method using atomic force microscopy to measure the locally induced anomalous Nernst effect. The tip contact creates a local temperature gradient on the sample surface controlled by a neighboring Joule heating…
We investigated insulating Cu$_2$N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling…
We present magnetic detection of a single, 2 {\mu}m diameter cobalt microparticle using an atomic magnetometer based on a microfabricated vapor cell. These results represent an improvement by a factor of 105 in terms of the detected…
In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral…
A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode.…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
We have developed a low temperature, high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300 N/m mounted with a commercial MFM cantilever…
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in an Ga[Al]As heterostructure. At different separations between AFM tip and…
CO-terminated tips currently provide the best spatial resolution obtainable in atomic force microscopy. Due to their chemical inertness, they allow to probe interactions dominated by Pauli repulsion. The small size and inertness of the…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
In this paper, we present a focused-ion-beam-assisted method for preparing magnet tips for magnetic resonance force microscopy measurements. The method electrostatically transfers prefabricated magnetic nanoparticles to microcantilevers,…
We fabricated cantilevers for magnetic force microscopy with carbon nanotube tips coated with magnetic material. Images of a custom hard drive demonstrated 20 nm lateral resolution, with prospects for further improvements.
Using density functional theory (DFT), we calculate the magnetic short-ranged exchange forces between a magnetic tip and an adatom adsorbed on the antiferromagnetic Mn monolayer on the W(110) surface [Mn/W(110)]. These exchange forces can…