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High-precision particle tracking devices allow for two-dimensional analyses of the material budget distribution of particle detectors and their periphery. In this contribution, the material budget of different targets is reconstructed from…
We explore the opportunities of using electron scattering by screened Coulomb potential as a tool to retrieve properties of the relativistic vortex beams of electrons, such as their transverse momentum and orbital angular momentum (OAM). We…
We present a measurement of multiple Coulomb scattering of 1 to 6 GeV/c electrons in thin (50-140 um) silicon targets. The data were obtained with the EUDET telescope Aconite at DESY and are compared to parametrisations as used in the…
We apply tomography, a general method for reconstructing 3-D distributions from multiple projections, to reconstruct the momentum distribution of electrons produced via strong field photoionization. The projections are obtained by rotating…
Due to the high penetrating power of cosmic ray muons, they can be used to probe very thick and dense objects. As charged particles, they can be tracked by ionization detectors, determining the position and direction of the muons. With…
Three-dimensional electron tomography is used to understand the structure and properties of samples in chemistry, materials science, geoscience, and biology. With the recent development of high-resolution detectors and algorithms that can…
Muon tomography is developing as a promising system to detect high-Z (atomic number) material for ensuring homeland security. In the present work, three kinds of spatial locations of materials which are made of aluminum, iron, lead and…
This paper describes a new method for momentum reconstruction of charged particles using multiple Coulomb scatterings in a nuclear emulsion detector with a layered structure of nuclear emulsion films and target materials. The method…
The angular distribution function of multiple scattering experienced by 855 MeV electrons passing through an amorphous silicon plate and an oriented silicon crystal has been studied by means of relativistic molecular dynamics simulations…
Strongly interacting electrons in clean two-dimensional devices are theorized to exhibit many distinct transport regimes, such as ballistic, hydrodynamic, or diffusive. Realistic samples often lie in crossover regimes between these…
Electron tomography is a widely used technique for 3D structural analysis of nanomaterials, but it can cause damage to samples due to high electron doses and long exposure times. To minimize such damage, researchers often reduce beam…
Cosmic rays interacting with the atmosphere result in a flux of secondary particles including muons and electrons. Atmospheric ray tomography (ART) uses the muons and electrons for detecting objects and their composition. This paper…
Using scanning gate microscopy (SGM), we probe the scattering between a beam of electrons and a two-dimensional electron gas (2DEG) as a function of the beam's injection energy, and distance from the injection point. At low injection…
The electronCT technique is an imaging method based on the multiple Coulomb scattering of relativistic electrons and has potential applications in medical and industrial imaging. It utilizes a pencil beam of electrons in the very high…
Using a high energy electron beam for the imaging of high density matter with both high spatial-temporal and areal density resolution under extreme states of temperature and pressure is one of the critical challenges in high energy density…
The numerical analysis of the diffraction features rendered by transmission electron microscopy (TEM) typically relies either on classical approximations (Monte Carlo simulations) or quantum paraxial tomography (the multislice method and…
Multiple scattering effects of 12 and 20 GeV electrons on 8 and 20 mm thickness carbon targets have been studied with high-resolution silicon microstrip detectors of the UA9 apparatus at the H8 line at CERN. Comparison of the scattering…
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent…
Electrical impedance tomography aims at reconstructing the conductivity inside a physical body from boundary measurements of current and voltage at a finite number of contact electrodes. In many practical applications, the shape of the…
There exist two groups of electron microscopy methods that are capable of providing three-dimensional (3D) structural information of an object, i.e., electron tomography and depth sectioning. Electron tomography is capable of resolving…