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Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares…

Materials Science · Physics 2024-08-06 Yansong Hao , Annick De Backer , Scott David Findlay , Sandra Van Aert

The evolution of dynamic processes in graphene-family materials are of great interest for both scientific purposes and technical applications. Scanning electron microscopy and transmission electron microscopy outstand among the techniques…

Electron microscopes have been improved to achieve ever smaller beam spots, a key parameter that determines the instrument's resolution. The techniques to measure the size of the beam, however, have not progressed to the same degree. There…

Applied Physics · Physics 2019-07-24 Matthew Zotta , Sharadh Jois , Prathamesh Dhakras , Miguel Rodriguez , Ji Ung Lee

A powerful technique is introduced for simulating mechanical and electromechanical properties of one-dimensional nanostructures under arbitrary combinations of bending, twisting, and stretching. The technique is based on a novel control of…

Mesoscale and Nanoscale Physics · Physics 2016-09-28 Pekka Koskinen

Controlled integration of metallic nanoparticles (NPs) onto photonic nanostructures enables realization of complex devices for extreme light confinement and enhanced light-matter interaction. This can be achieved combining…

Strong multiple scattering of the probe in scanning transmission electron microscopy (STEM) means image simulations are usually required for quantitative interpretation and analysis of elemental maps produced by electron energy-loss…

Materials Science · Physics 2019-12-25 Hamish G. Brown , Jim Ciston , Colin Ophus

Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity…

Materials Science · Physics 2022-07-28 Andy Bridger , William I. F. David , Thomas J. Wood , Mohsen Danaie , Keith T. Butler

We explore the emergence and active control of optical bistability in a two-level atom near a graphene sheet. Our theory incorporates self-interaction of the optically-driven atom and its coupling to electromagnetic vacuum modes, both of…

Quantum Physics · Physics 2023-01-24 Mikkel Have Eriksen , Jakob E. Olsen , Christian Wolff , Joel D. Cox

Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or…

Instrumentation and Detectors · Physics 2026-04-23 Matthew Mosse , Jonathan J. P. Peters , Eoin Moynihan , James A. Gott , Ana M. Sanchez , Michele Conroy , Lewys Jones

Two-dimensional crystals and their heterostructures unlock access to a class of photonic devices, bringing nanophotonics from the nanometer scale down to the atomic level where quantum effects are relevant. Single-photon emitters (SPEs) are…

The interest in two-dimensional and layered materials continues to expand, driven by the compelling properties of individual atomic layers that can be stacked and/or twisted into synthetic heterostructures. The plethora of electronic…

Free electron beams such as those employed in electron microscopes have evolved into powerful tools to investigate photonic nanostructures with an unrivaled combination of spatial and spectral precision through the analysis of electron…

Quantum Physics · Physics 2021-04-22 F. Javier García de Abajo , Valerio Di Giulio

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly…

Applications · Statistics 2019-08-27 Xin Li , Ondrej Dyck , Stephen Jesse , Andrew R. Lupini , Sergei V. Kalinin , Mark P. Oxley

Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration…

Materials Science · Physics 2023-06-29 Juhyeok Lee , Moosung Lee , YongKeun Park , Colin Ophus , Yongsoo Yang

The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…

Here we explore the use of scanning electron diffraction coupled with electron atomic pair distribution function analysis (ePDF) to understand the local order as a function of position in a complex multicomponent system, a hot rolled,…

Ultracold quantum gases offer unique possibilities to study interacting many-body quantum systems. Probing and manipulating such systems with ever increasing degree of control requires novel experimental techniques. Scanning electron…

Quantum Gases · Physics 2015-09-14 Bodhaditya Santra , Herwig Ott

Dielectrophoresis is a very promising technique for particle manipulation on a chip. In this study, we demonstrate a controlled mannuvering of polystryrene particles on a simple paper-and-pencil based device by exploiting the underlying…

Soft Condensed Matter · Physics 2019-11-13 Sankha Shuvra Das , Shantimoy Kar , Sayantan Dawn , Partha Saha , Suman Chakraborty

The operation principles of nanoscale devices are based upon both electronic and mechanical properties of materials. Because these properties can be coupled, they need to be investigated simultaneously. At this moment, however, the…

Materials Science · Physics 2010-11-24 Pekka Koskinen , Oleg O. Kit

Graphene nanopatterning on highly oriented pyrolytic graphite (HOPG) has previously been shown using both atomic force microscopy (AFM) and scanning tunneling microscopy (STM) based techniques, including folding of intrinsic step edges and…

Mesoscale and Nanoscale Physics · Physics 2018-12-27 Kim Akius , Jan van Ruitenbeek