Related papers: Optical identification using imperfections in 2D m…
The control in optical uniformity of single nanoparticles and tuning their diversity in orthogonal dimensions, dot to dot, holds the key to unlock nanoscience and applications. Here we report that the time-domain emissive profile from…
Characterising charge transport in a material is central to the understanding of its electrical properties, and can usually only be inferred from bulk measurements of derived quantities such as current flow. Establishing connections between…
First isolated in 2004, graphene monolayers display unique properties and promising technological potential in next generation electronics, optoelectronics, and energy storage. The simple yet effective methodology, mechanical exfoliation…
We demonstrate a method to image an object using a self-probing approach based on semiconductor high-harmonic generation. On one hand, ptychography enables high-resolution imaging from the coherent light diffracted by an object. On the…
Optical imaging technologies are central to discovery in the life and physical sciences, yet their impact depends on how readily they can be built, adapted, and sustained across laboratories. Digital fabrication, including desktop 3D…
Identifying similar materials, i.e., those sharing a certain property or feature, requires interoperable data of high quality. It also requires means to measure similarity. We demonstrate how a spectral fingerprint as a descriptor, combined…
Photonic crystals with a sufficiently high refractive index contrast display partial or full band gaps. However, imperfections in the metamaterial cause light scattering and extinction of the interfering propagating waves. Positive as well…
Doping impurity atoms is a strategy commonly used to tune the functionality of materials including catalysts, semiconductors, and quantum emitters. The location of dopants and their interaction with surrounding atoms could significantly…
Internal properties of a sample can be observed by medical imaging tools, such as ultrasound devices, magnetic resonance imaging (MRI) and optical coherence tomography (OCT) which are based on relying on changes in material density or…
Photonic crystals allow unprecedented control over how light is confined, propagates, and interacts with matter. Their development has had a transformative impact on optics and physics, and they remain the central platform for both…
This paper presents a new approach for embedding authentication information into image on printed materials based on optical projection technique. Our experimental setup consists of two parts, one is a common camera, and the other is a LCD…
In manufacturing processes, surface inspection is a key requirement for quality assessment and damage localization. Due to this, automated surface anomaly detection has become a promising area of research in various industrial inspection…
Characterization of atomic-scale materials traditionally requires human experts with months to years of specialized training. Even for trained human operators, accurate and reliable characterization remains challenging when examining newly…
We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that…
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
We present a light field imaging system that captures multiple views of an object with a single shot. The system is designed to maximize the total light collection by accepting a larger solid angle of light than a conventional lens with…
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with…
An original idea of semiconductor defects identification in CCD matrix was presented in the article. The procedure is simple and easy to execute because of no need for special and expensive equipment. The method classifies defects into two…
The analysis of defects and defect dynamics in crystalline materials is important for fundamental science and for a wide range of applied engineering. With increasing system size the analysis of molecular-dynamics simulation data becomes…
Structured materials like photonic crystals require for optimal use a high precision both on position and optical characteristics of the components which they are made of. Here, we present a simple tomographic algorithm, based on a specific…