Related papers: Background force compensation in dynamic atomic fo…
Ultrasound Atomic Force Microscopy (US-AFM) has been used for subsurface imaging of nanostructures. The contact stiffness variations have been suggested as the origin of the image contrast. Therefore, to analyze the image contrast, the…
Light, weakly coupled bosonic particles such as axions can mediate long range monopole-dipole interactions between matter and spins. We propose a new experimental method using atom interferometry to detect such a force on a freely falling…
We propose a two-frequency driving scheme in dynamic atomic force microscopy that maximizes the interaction time between tip and sample. Using a stochastic description of the cantilever dynamics, we predict large classical squeezing and a…
Vibration compensation is important for many domains. For the machine tool industry it translates to higher machining precision and longer component lifetime. Current methods for vibration damping have their shortcomings (e.g. need for…
Future high-sensitivity measurements of the cosmic microwave background (CMB) anisotropies and energy spectrum will be limited by our understanding and modeling of foregrounds. Not only does more information need to be gathered and…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…
The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…
The surface diffusion potential landscape plays an essential role in a number of physical and chemical processes such as self-assembly and catalysis. Diffusion energy barriers can be calculated theoretically for simple systems, but there is…
The problem of detecting new signals in the presence of an unknown background is ubiquitous in scientific discoveries and is especially prominent in the physical sciences. Most solutions proposed thus far to address the problem focus on…
In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…
Atomic Force Microscopy (AFM) conventional static force curves and Force Feedback Microscopy (FFM) force curves acquired with the same cantilever at the solid/air and solid/liquid interfaces are here compared. The capability of the FFM to…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A…
Raman spectroscopy has attracted interest as a non-invasive optical technique to study the composition and structure of a wide range of materials at the microscopic level. The intrinsic fluorescence background can be orders of magnitude…
Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
Friction is one of the fundamental issues in physics, mechanics and material science with lots of practical applications. However, the understanding of macroscopic friction phenomena from microscopic aspect is still on the way. In this…
The interpretation of ferroelectric domain images obtained with piezoresponse force microscopy (PFM) is discussed. The influences of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion)…
We consider the dynamics of a charged particle interacting with background electromagnetic field under the influence of linearized gravitational waves in the long wave-length and low-velocity limit. Following the prescription in…