Related papers: Automated cantilever exchange and optical alignmen…
The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…
Atom interferometers offer excellent sensitivity to gravitational and inertial signals but have limited dynamic range. We introduce a scheme that improves on this trade-off by a factor of 50 using composite fringes, obtained from sets of…
We report on the experimental demonstration of a horizontal accelerometer based on atom interferometry using counterpropagative Raman transitions between the states $F=1,m_F=\mp1$ and $F=2,m_F=\pm1$ of $^{87}$Rb. Compared to the $F=1,m_F=0…
Nonlinear interferometers that replace beamsplitters in Mach-Zehnder interferometers with nonlinear amplifiers for quantum-enhanced phase measurements have drawn increasing interest in recent years, but practical quantum sensors based on…
Analysis of microscope images is a tedious work which requires patience and time, usually done manually by the microscopist after data collection. Here we introduce an approach of automatic image analysis, which is based on locally applied…
The periodicity inherent to any interferometric signal entails a fundamental trade-off between sensitivity and dynamic range of interferometry-based sensors. Here we develop a methodology for significantly extending the dynamic range of…
A method is presented for calibrating the higher eigenmodes (resonance modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating…
Atomic force microscopy (AFM or SPM) imaging is one of the best matches with machine learning (ML) analysis among microscopy techniques. The digital format of AFM images allows for direct utilization in ML algorithms without the need for…
In this work is presented a microbalance for single microparticle sensing based on resonating AFM cantilever. The variation of the resonator eigenfrequency is related to the particle mass positioned at the free apex of the cantilever. An…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
When arranging objects with robotic arms, the quality of the end result strongly depends on the achievable placement accuracy. However, even the most advanced robotic systems are prone to positioning errors that can occur at different steps…
Extracting standardized metallurgical metrics from microscopy images remains challenging due to complex grain morphology and the data demands of supervised segmentation. To bridge foundational computer vision with practical metallurgical…
We realize a Mach-Zehnder-type dual-atom-interferometer gyroscope with an interrogation arm of 40 cm length and the interference area up to 1.2 cm$^2$. The precise angular alignment of the large-scale separated Raman lasers is demonstrated…
We propose a scheme to exchange optical vortices of slow light using the phenomenon of electromagnetically induced transparency (EIT) in a four-level double-$\Lambda$ atom-light coupling scheme illuminated by a pair of probe fields as well…
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation,…
In a stack of atomically-thin Van der Waals layers, introducing interlayer twist creates a moir\'e superlattice whose period is a function of twist angle. Changes in that twist angle of even hundredths of a degree can dramatically transform…
We present here a novel cantilever based apparatus to perform translational stress or strain controlled rheology in very soft solids, and obtain simultaneous confocal imaging of the 3 dimensional microstructure. The stress is measured using…
A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digital phase-locked loop (PLL). The PLL is not only used as a…