Related papers: Diminish Electrostatic in Piezoresponse Force Micr…
We describe and demonstrate a method by which the nonlinear piezoelectric properties of a piezoelectric material may be measured by detecting the force that it applies on a suspended micromechanical resonator at one of its mechanical…
An interesting aspect in the research of complex (dusty) plasmas is the experimental study of the interaction of micro-particles with the surrounding plasma for diagnostic purposes. Local electric fields can be determined from the behaviour…
Optical methods for monitoring the electrochemical reaction at the interface are advantageous because of their table-top setup and ease of integration into reactors. Here we apply EDL-modulation microscopy to one of the main components of…
We present a study of the piezostrain-tunable gyrotropic dynamics in Co$_{40}$Fe$_{40}$B$_{20}$ vortex microstructures fabricated on a 0.7PMN-0.3PT single crystalline substrate. Using field-modulated spin rectification measurements, we…
In this work we introduce a new method of a ferromagnetic resonance (FMR) detection from thin, nm-size, films. Our setup is based on the commercial piezo-cantilever, used for atomic force microscopy. It has an option to rotate the sample in…
Miniaturized mechanical resonators have proven to be excellent force sensors. However, they usually rely on resonant sensing schemes, and their excellent performance cannot be utilized for the detection of static forces. Here, we report on…
Electrostatic forces between small groups of colloidal particles are measured using blinking optical tweezers. When the electrostatic screening length is significantly larger than the particle radius, forces are found to be non-pairwise…
Piezoelectrics interconvert mechanical energy and electric charge and are widely used in actuators and sensors. The best performing materials are ferroelectrics at a morphotropic phase boundary (MPB), where several phases can intimately…
Buckling at the micro and nanoscale generates distant bistable states which can be beneficial for sensing, shape-reconfiguration and mechanical computation applications. Although different approaches have been developed to access buckling…
We report a new spin manipulation protocol for periodically reversing the sample magnetization for Magnetic Resonance Force Microscopy. The protocol modulates the microwave excitation frequency synchronously with the position of the…
This paper reports on the systematic electromechanical characterization of a new three-axial force sensor used in dimensional metrology of micro components. The siliconbased sensor system consists of piezoresistive mechanicalstress…
We investigate the electromechanical interactions in individual P(VDF-TrFE) nanowires in response to localized electrical poling via a conducting atomic force microscope tip. Spatially resolved measurements of piezoelectric coefficients and…
We compute electrostatic fields induced deformations of cantilevered finite-length metallic carbon nanotubes, using an energy minimization method based on a charge-dipole moment interaction potential combined with an empirical many-body…
We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…
The search for electric dipole moments of particles in storage rings requires the development of dedicated deflector elements with electrostatic fields. In these rings, electric deflectors shall be used as bending elements for the charged…
Although extensively presented as one of the most promising silicon-based micromachined sensor adapted to real-time measurements in liquid media, the cantilevered structure still suffers from its quality factor (Q) dramatic dependence on…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…
Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse…
Despite extensive research on piezoelectric polymers since the discovery of piezoelectric poly(vinylidene fluoride) (PVDF) in 1969, the fundamental physics of polymer piezoelectricity has remained elusive. Based on the classic principle of…