English
Related papers

Related papers: Piezo-generated charge mapping revealed through Di…

200 papers

The denominated surface charge scraping mechanism was discovered in 2014 by using a new Atomic Force Microscopy (AFM) based mode called Charge Gradient Microscopy. The measurements to probe such mechanism are achieved with the use of a…

Applied Physics · Physics 2018-09-10 A. Gomez

Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long term development for reducing the sizes of devices, the preparation of ferroelectric materials and devices are entering…

Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes.…

Materials Science · Physics 2016-11-15 Sergei V. Kalinin , Andrei Rar , Stephen Jesse

Piezoelectric semiconductor III-Nitride nanostructures have received increasing interest as an alternative material for energy harvesters, sensors, and self-sustainable electronics, demanding well-clarification of their piezoelectric…

Materials Science · Physics 2020-12-08 L. Jaloustre , S. Le-Denmat , T. Auzelle , M. Azadmand , L. Geelhaar , F. Dahlem , R. Songmuang

A nanometric needle sensor mounted in an Atomic Force Microscopy allows systematic picometer-range distance measurements. This force sensing device is used in Piezoresponse Force Microscopy (PFM) as a distance sensor, by employing the…

Materials Science · Physics 2017-12-01 A. Gomez , H. T. T Nong , S. Mercone , T. Puig , X. Obradors

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

Mesoscale and Nanoscale Physics · Physics 2025-04-21 Roger Proksch , Ryan Wagner

Ferroelectric materials have remained one of the foci of condensed matter physics and materials science for over 50 years. In the last 20 years, the development of voltage-modulated scanning probe microscopy techniques, exemplified by…

Materials Science · Physics 2017-01-06 Rama K. Vasudevan , Nina Balke , Peter Maksymovych , Stephen Jesse , Sergei V. Kalinin

Hafnium oxide (HfO2)-based ferroelectrics offer remarkable promise for memory and logic devices in view of their compatibility with traditional silicon CMOS technology, high switchable polarization, good endurance and thickness scalability.…

Applied Physics · Physics 2020-04-29 Liam Collins , Umberto Celano

Piezoelectric nanowires are promising materials for sensing, actuation and energy harvesting, due to their enhanced properties at the nanoscale. However, quantitative characterization of piezoelectricity in nanomaterials is challenging due…

Mesoscale and Nanoscale Physics · Physics 2021-02-08 Yonatan Calahorra , Wonjong Kim , Jelena Vukajlovic Plestina , Anna Fontcuberta i Morral , Sohini Kar-Narayan

The structure of a single antiparallel ferroelectric domain wall in LiNbO3 is quantitatively mapped by piezoelectric force microscopy (PFM) with calibrated probe geometry. The PFM measurements are performed for 49 probes with the radius…

Piezoresponse force microscopy (PFM) has been widely used for nanoscale analysis of piezoelectric properties and ferroelectric domains. Although PFM is useful because of its simple and nondestructive features, PFM measurements can be…

Applied Physics · Physics 2023-05-09 Jaegyu Kim , Seongwoo Cho , Jiwon Yeom , Seongmun Eom , Seungbum Hong

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response…

Materials Science · Physics 2017-04-04 Daehee Seol , Bora Kim , Yunseok Kim

The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…

Mesoscale and Nanoscale Physics · Physics 2019-04-16 Liam Collins , Yongtao Liu , Olga Ovchinnikova , Roger Proksch

Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction…

Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-ferroelectric materials can also generate similar responses…

Materials Science · Physics 2018-09-13 Yue Liu , Yao Sun , Wanheng Lu , Hongli Wang , Zhongting Wang , Bingxue Yu , Tao Li , Kaiyang Zeng

Piezoelectricity, the generation of electric charge in response to mechanical stress, is a key property in both natural and synthetic materials. This study significantly boosts the piezoelectric response of chitosan, a biodegradable…

Strong coupling between electrical and mechanical phenomena and the presence of switchable polarization have enabled applications of ferroelectric materials for nonvolatile memories (FeRAM), data storage, and ferroelectric lithography.…

We report the first investigation of the piezoelectric response on a nanoscale in the poled ferroelectric crystals with engineered configuration of domains. Piezoresponse force microscopy of tetragonal 0.63PMN-0.37PT relaxor-based…

Materials Science · Physics 2011-08-23 Haiyan Guo , Alexei A. Bokov , Zuo-Guang Ye

To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside…

Materials Science · Physics 2009-11-10 Sergei V. Kalinin , Edgar Karapetian , Mark Kachanov
‹ Prev 1 2 3 10 Next ›