Related papers: Understanding the Plasmonics of Nanostructured Ato…
This article reviews the new developments in Tip-enhanced Raman scattering (TERS). The fundamental mechanisms underlying the Raman enhancement are discussed, including the role of the plasmonic character of the metallic tips, the nature of…
An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…
Optical field localization at plasmonic tip-sample nanojunctions has enabled high spatial resolution chemical analysis through tip-enhanced linear optical spectroscopies, including Raman scattering and photoluminescence. Here, we illustrate…
Tip functionalization in AFM allows imaging organic nano-structures with sub-molecular resolution. Here, recent progress by using atomically defined copper-oxide tips is discussed. With their outstanding rigidity and elemental selectivity…
Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…
New type of plasmonic nanoparticles - silver octopods that can be synthesized with a variety of shapes - have been demonstrated to show versatile optical response using the discrete dipole approximation. The octopods show a complex behavior…
Experimental evidence suggests an extremely high, possibly even sub-molecular, spatial resolution of tip-enhanced Raman spectroscopy. While the underlying mechanism is currently still under discussion, two main contributions are considered:…
High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…
Tip-enhanced Raman spectroscopy (TERS) typically relies on high-NA excitation to generate a strong axial field at the tip apex, which shortens the working distance and constrains sample geometries. We show that a plasmonic bi-cavity tip,…
Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…
Plasmonics, the science and technology of the interaction of light with metallic objects, is fundamentally changing the way we can detect, generate and manipulate light. Although the field is progressing swiftly, thanks to the availability…
We report a detailed study of the strong near-field Raman scattering enhancement which takes place in tip-enhanced Raman scattering (TERS) in indium nitride. In addition to the well-known first-order optical phonons of indium nitride,…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Tip-enhanced Raman spectroscopy (TERS) is a valuable method for surface analysis with nanometer to angstrom-scale resolution, however, the accurate simulation of particular TERS signals remains a computational challenge. We present a unique…
The characteristic tip_substrate capacitance is crucial for understanding the localized electrical properties in atomic force microscopy (AFM). Since it is highly dependent on tip geometrical features, estimation of the tip_substrate…
A significant part of the optical metamaterial phenomena has the plasmonic nature and their investigation requires very accurate knowledge of the fabricated structures shape with a focus on the periodical features. We describe a consistent…
We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…
Sharp metal corners and tips support plasmons localized on the scale of the curvature radius -- superlocalized plasmons. We analyze plasmonic properties of nanoparticles with small and sharp corner- and tip-shaped surface perturbations in…
The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…