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The activated torsion oscillation magnetometer exploits the mechanical resonance of a cantilever beam, driven by the torque exerted on the sample by an ac field applied perpendicularly to the film plane. We describe a model for the…

Condensed Matter · Physics 2009-11-07 G. Asti , M. Ghidini , R. Pellicelli , M. Solzi

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

Instrumentation and Detectors · Physics 2015-11-24 Luca Costa , Mario S Rodrigues

Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force…

Mesoscale and Nanoscale Physics · Physics 2023-10-10 Roger Proksch , Ryan Wagner , Joel Lefever

The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…

Atomic and Molecular Clusters · Physics 2016-08-16 Gérard Couturier , Rodolphe Boisgard , Laurent Nony , Jean-Pierre Aimé

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…

Instrumentation and Detectors · Physics 2017-04-28 Gustavo Cordova , Brenda Yasie Lee , Zoya Leonenko

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…

Applied Physics · Physics 2024-06-19 Omur E Dagdeviren

In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions often depend on the tip velocity and the past tip trajectory.…

Mesoscale and Nanoscale Physics · Physics 2013-01-31 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and…

Instrumentation and Detectors · Physics 2007-05-23 V. P. Tichinsky , A. V. Kretushev , P. N. Luskinovich

We consider the stochastic dynamics of an array of two closely spaced atomic force microscope cantilevers in a viscous fluid for use as a possible biomolecule sensor. The cantilevers are not driven externally, as is common in applications…

Mesoscale and Nanoscale Physics · Physics 2009-11-11 M. T. Clark , M. R. Paul

Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…

Systems and Control · Computer Science 2023-01-05 Marco Coraggio , Martin Homer , Oliver D. Payton , Mario di Bernardo

Small-amplitude dynamic atomic force microscopy (dynamic-AFM) in a simple nonpolar liquid was studied through molecular dynamics simulations. We find that within linear dynamics regime, the contact stiffness and damping of the confined film…

Materials Science · Physics 2016-05-04 Rong-Guang Xu , Yongsheng Leng

Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf,…

Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…

Soft Condensed Matter · Physics 2007-05-23 Davood Norouzi , Martin Michael Mueller , Markus Deserno

In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…

Mesoscale and Nanoscale Physics · Physics 2017-08-01 Joseph L. Garrett , Lisa J. Krayer , Kevin J. Palm , Jeremy N. Munday

Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…

Applied Physics · Physics 2024-11-26 Kenichi Umeda , Noriyuki Kodera

We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low…

While Atomic Force Microscopy is mostly used to investigate surface properties, people have almost since its invention sought to apply its high resolution capability to image also structures buried within samples. One of the earliest…

Nonlinear interferometers that replace beamsplitters in Mach-Zehnder interferometers with nonlinear amplifiers for quantum-enhanced phase measurements have drawn increasing interest in recent years, but practical quantum sensors based on…

Quantum Physics · Physics 2020-07-01 R. C. Pooser , N. Savino , E. Batson , J. L. Beckey , J. Garcia , B. J. Lawrie

Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…

Applied Physics · Physics 2019-01-23 M. Teresa Cuberes

Recent advances in the fabrication of microelectromechanical systems (MEMS) and their evolution into nanoelectromechanical systems (NEMS) have allowed researchers to measure extremely small forces, masses, and displacements. In particular,…

Mesoscale and Nanoscale Physics · Physics 2008-08-02 M. Poggio , M. P. Jura , C. L. Degen , M. A. Topinka , H. J. Mamin , D. Goldhaber-Gordon , D. Rugar