Related papers: Bright focused ion beam sources based on laser-coo…
Several ion source alternatives for current focused ion beam (FIB) systems have been studied to achieve higher brightness, including cold atom ion sources. However, a study of ultracold ions interacting with often used materials is seldom…
Making use of focused Ga-ion beam (FIB) fabrication technology, the evolution with device dimension of the low-temperature electrical properties of Nb nanowires has been examined in a regime where crossover from Josephson-like to insulating…
We demonstrate a new focused ion beam sample preparation method for atom probe tomography. The key aspect of the new method is that we use a neon ion beam for the final tip-shaping after conventional annulus milling using gallium ions. This…
Hot cavity resonant ionization laser ion sources (RILIS) provide a multitude of radioactive ion beams with high ionization efficiency and element selective ionization. However, in hot cavity RILIS there still remains isobaric contaminations…
Focused ion beam milling allows manipulation of the shape and size of nanostructures to create geometries potentially useful for opto-electronics, thermoelectrics, and quantum computing. We focus on using the ion beam to control the…
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter…
In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a micrograph. Randomness of the number of incident particles…
The Nitrogen Vacancy color center (NV-) in diamond is of great interest for novel photonic applications. Diamond nano-photonic structures are often implemented using Focused-Ion-Beam (FIB) processing, leaving a damaged surface which has a…
In the main magnetic focus ion source, atomic ions are produced in the local ion trap created by the rippled electron beam in focusing magnetic field. Here we present the novel modification of the room-temperature hand-size device, which…
A novel room-temperature ion source for the production of atomic ions in electron beam within wide ranges of electron energy and current density is developed. The device can operate both as conventional Electron Beam Ion Source/Trap…
Ion beam analysis techniques are among the most powerful tools for advanced material characterization. Despite their growing relevance in a widening number of fields, most ion beam analysis facilities still rely on the oldest accelerator…
A beam of free alkali metal nanoparticles is produced by a condensation source, passed through a thermalizing tube adjustable over a broad temperature range, and ionized by tunable light. High stability of the particle flux and an automated…
The major challenges to fabricate quantum processors and future nano solid state devices are material modification techniques with nanometre resolution and suppression of statistical fluctuations of dopants or qubit carriers. Based on a…
Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyping. Although the lateral spread of the ion beam is often…
We demonstrate and characterize a high-flux beam source for cold, slow atoms or molecules. The desired species is vaporized using laser ablation, then cooled by thermalization in a cryogenic cell of buffer gas. The beam is formed by…
An electron-impact ion source based on photoelectron emission was developed for ionization of gases at pressures below 1e-4 mbar in an axial magnetic field in the order of 5 T. The ion source applies only DC fields, which makes it suitable…
We produce large numbers of low-energy ions by photoionization of laser-cooled atoms inside a surface-electrode-based Paul trap. The isotope-selective trap loading rate of $4\times10^{5}$ Yb$^{+}$ ions/s exceeds that attained by…
High-brightness muon beams of energy comparable to those produced by state-of-the-art electron, proton and ion accelerators have yet to be realised. Such beams have the potential to carry the search for new phenomena in lepton-antilepton…
Important advantages of heavy ion beam (HIB) irradiation of matter are discussed in comparison with traditional sources - laser heating, electron beam, electrical discharge etc. High penetration length (~ 10 mm) is of primary importance for…
Ion sources are a critical component of all particle accelerators. They create the initial beam that is accelerated by the rest of the machine. This paper will introduce the many methods of creating a beam for high-power hadron…