Related papers: Spatial resolution in atom probe tomography
Spatial resolution is a fundamental parameter in structural sciences. In crystallography, the resolution is determined from the detection limit of high-angle diffraction in reciprocal space. In electron microscopy, correlation in the…
This work develops new numerical methods for the solution of the tomography problem in domains with reflecting obstacles. We compare the solution's performance for Lambertian reflection, for classical tomography with ubroken rays and for…
Atomic-scale characterization of spin textures in solids is essential for understanding and tuning properties of magnetic materials and devices. While high-energy electrons are employed for atomic-scale imaging of materials, they are…
High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…
Quantification of sputter depth profiles is frequently done by fitting the convolution integral over concentration and depth resolution function. For a thin delta layer, there exist analytical solutions. The analytical depth resolution…
Scanning tunneling microscope (STM) has presented a revolutionary methodology to the nanoscience and nanotechnology. It enables imaging the topography of surfaces, mapping the distribution of electronic density of states, and manipulating…
In recent years nanoscale coherent imaging has emerged as an indispensable imaging modality allowing to surpass the resolution limit given by classical imaging optics. At the same time, attosecond science has experienced enormous progress…
Super-resolution is generally referred to as the task of recovering fine details from coarse information. Motivated by applications such as single-molecule imaging, radar imaging, etc., we consider parameter estimation of complex…
This work describes extensions to existing level-set algorithms developed for application within the field of Atom Probe Tomography (APT). We present a new simulation tool for the simulation of 3D tomographic volumes, using advanced level…
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
The mechanism of describing quantum states by standard probability (tomographic one) instead of wave function or density matrix is elucidated. Quantum tomography is formulated in an abstract Hilbert space framework, by means of the identity…
Ultrafast scattering using X-rays or electrons is an emerging method to obtain structure dynamics at the atomic length and time scales. However, directly resolving in real-space atomic motions is inherently limited by the finite detector…
This work develops new numerical methods for the solution of the tomography problem in domains with reflecting obstacles. We compare the solution's performance for Lambertian reflection, for classical tomography with unbroken rays and for…
Electron tomography, as an important 3D imaging method, offers a powerful method to probe the 3D structure of materials from the nano- to the atomic-scale. However, as a grant challenge, radiation intolerance of the nanoscale samples and…
Super-resolution is a machine-learning technique in image processing which generates high-resolution images from low-resolution images. Inspired by this approach, we perform a numerical experiment of quantum machine learning, which takes…
Tendencies in five main branches of atomic spectrometry (absorption, emission, mass, fluorescence and ionization spectrometry) are considered. The first three techniques are the most widespread and universal, with the best sensitivity…
Analysis of geostatistical data is often based on the assumption that the spatial random field is isotropic. This assumption, if erroneous, can adversely affect model predictions and statistical inference. Nowadays many applications…
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…
Raman spectroscopy stands as a cornerstone technique for probing collective excitations and emergent quantum phases in solids. While polarization-resolved Raman scattering has been widely used to extract symmetry information of eigenmodes,…
Two decades after its introduction, laser-assisted Atom Probe Tomography (La-APT) has demonstrated a unique potential for the study of the 3D distribution of atomic species in semiconductor materials and devices, and in a growing list of…