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When light hits a multilayer planar stack, it is reflected, refracted, and absorbed in a way that can be derived from the Fresnel equations. The analysis is treated in many textbooks, and implemented in many software programs, but certain…

Computational Physics · Physics 2021-01-01 Steven J. Byrnes

X-ray resonant magnetic reflectivity (XRMR) allows for the simultaneous measurement of structural, optical and magnetooptic properties and depth profiles of a variety of thin film samples. However, a same-beamtime same-sample systematic…

The structural characterization is an essential task in the study of porous materials. To achieve reliable results, it requires to evaluate images with hundreds of pores. Current methods require large time amounts and are subjected to human…

Soft Condensed Matter · Physics 2025-02-12 Jorge Torre , Suset Barroso-Solares , M. A. Rodríguez-Pérez , Javier Pinto

Nanolayer stacks are technologically very relevant for current and future applications in many fields of research. A non-destructive characterization of such systems is often performed using X-ray reflectometry (XRR). For complex stacks of…

The synthesis and structural analysis of Mo/B periodical multilayer X-ray mirrors (PMMs) for beyond extreme ultraviolet (BEUV) optics was performed. The PMMs were deposited by a combination of pulsed DC and radio frequency (RF) magnetron…

Applied Physics · Physics 2020-11-13 Oleksiy V. Penkov , Igor A. Kopylets , Valeriy V. Kondratenko , Mahdi Khadem

In this paper a theory of reflective X-ray multilayer structures with a graded (slowly varying) period based on the coupled waves method and quasi-classical asymptotic expansions is reported. A number of exact solutions of the coupled wave…

Optics · Physics 2022-04-26 R. M. Feshchenko

The Shear TEsting Programme (STEP) is a collaborative project to improve the accuracy and reliability of weak lensing measurement, in preparation for the next generation of wide-field surveys. We review sixteen current and emerging shear…

Accurate thermal analysis of composites and porous media requires detailed characterization of local thermal properties in small scale. For some important applications such as lithium-ion batteries, changes in the properties during the…

Applied Physics · Physics 2020-10-06 Fazlolah Mohaghegh , Jayathi Murthy

Photoelectron diffraction (PED) is a powerful and essential experimental technique for resolving the structure of surfaces with sub-angstrom resolution. In the high energy regime, researchers in angle-resolved photoemission spectroscopy…

A simple X-ray imaging system using off-the-shelf electronics and simple reconstruction algorithms aiming a spatial resolution of 1.7 mm ($\sim 3\,\%$ of the detector length) is described in this work. For this, two 100 cm$^2$ Gas Electron…

Instrumentation and Detectors · Physics 2015-06-18 H. Natal da Luz , J. A. Mir , X. Carvalho , J. M. F. dos Santos

The imaging performance and sensitivity of an X-ray telescope when observing astrophysical sources are primarily governed by the optical design, geometrical uncertainties (figure errors, surface roughness, and mirror alignment…

Instrumentation and Methods for Astrophysics · Physics 2024-05-13 Neeraj K. Tiwari , Santosh V. Vadawale , N. P. S. Mithun , C. S. Vaishnava , Bharath Saiguhan

We present LayerPCM, an extension of the polarizable-continuum model coupled to real-time time-dependent density-functional theory for an efficient and accurate description of the electrostatic interactions between molecules and…

Materials Science · Physics 2021-06-17 Jannis Krumland , Gabriel Gil , Stefano Corni , Caterina Cocchi

This work discusses an extension to conventional low-coherence interferometry by the introduction of dispersion-encoding. The extension facilitates the measurement of surface height profiles with sub-nm resolution. The selection of a…

Optics · Physics 2021-05-24 Christopher Taudt

Measurement of the optical transmission matrix (TM) of an opaque material is an advanced form of space-variant aberration correction. Beyond imaging, TM-based methods are emerging in a range of fields including optical communications,…

We explore the application of computer vision and machine learning (ML) techniques to predict material properties (e.g. compressive strength) based on SEM images. We show that it's possible to train ML models to predict materials…

X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical…

Optics · Physics 2013-04-05 D. Spiga , L. Raimondi , C. Svetina , M. Zangrando

Beam prediction is an effective approach to reduce training overhead in massive multiple-input multiple-output (MIMO) systems. However, existing beam prediction models still exhibit limited generalization ability in diverse scenarios, which…

Signal Processing · Electrical Eng. & Systems 2025-06-09 Yizhu Zhao , Li Yu , Lianzheng Shi , Jianhua Zhang , Guangyi Liu

Intentionally deposited thin films exposed to atmosphere often develop unintentionally deposited few monolayer films of surface contamination. This contamination arises from the diverse population of volatile organics and inorganics in the…

Mesoscale and Nanoscale Physics · Physics 2012-10-03 David L. Gil , Donald Windover

The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has…

Strongly Correlated Electrons · Physics 2015-05-13 A. Verna , B. A. Davidson , Y. Szeto , A. Yu. Petrov , A. Mirone , A. Giglia , N. Mahne , S. Nannarone

The problem of determining the porous silicon (PSi) optical constants, thickness, porosity, and surface quality using just reflectance data is board employing evolutionary algorithms. The reflectance measurements were carried out of PSi…

Materials Science · Physics 2018-09-12 C. F. Ramirez-Gutierrez , J. D. Castaño-Yepes , M. E. Rodriguez-Garcia