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Related papers: Interplay between O defects and SiC stacking at th…

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We present an orbital-resolved density functional theory study on the electronic properties of hydrogen and lithium intercalated graphene grown on the Si face of SiC. Starting from the $(6\sqrt3\times6\sqrt3)R30^{\circ}$ surface…

Mesoscale and Nanoscale Physics · Physics 2012-01-17 I. Deretzis , A. La Magna

The divacancy comprising two neighboring vacant sites in the SiC lattice is a promising defect for applications in quantum technology. So far, most work is concerned with the divacancy in 4H-SiC, whereas the divacancies in 6H- and 3C-SiC…

Quantum Physics · Physics 2025-06-25 Danial Shafizade , Joel Davidsson , Takeshi Ohshima , Nguyen Tien Son , Ivan G. Ivanov

At interfaces between complex oxides it is possible to generate electronic systems with unusual electronic properties, which are not present in the isolated oxides. One important example is the appearance of superconductivity at the…

Superconductivity · Physics 2016-07-13 D. Di Castro , C. Cantoni , F. Ridolfi , C. Aruta , A. Tebano , N. Yang , G. Balestrino

The potential of graphene to impact the development of the next generation of electronics has renewed interest in its growth and structure. The graphitization of hexagonal SiC surfaces provides a viable alternative for the synthesis of…

Mesoscale and Nanoscale Physics · Physics 2015-05-13 Y. Qi , S. H. Rhim , G. F. Sun , M. Weinert , L. Li

The role of interface states and dielectric mismatch is studied in ultrathin P-doped silicon-on-insulator (SOI) films with thickness of the device layer ($H_{SOI}$) varying from 30 to 8 nm and dopant concentration ($n_{D}$) ranging from…

Interface disorder and its effect on the valley degeneracy of the conduction band edge remains among the greatest theoretical challenges for understanding the operation of spin qubits in silicon. Here, we investigate a counterintuitive…

Mesoscale and Nanoscale Physics · Physics 2011-02-15 A. L. Saraiva , Belita Koiller , Mark Friesen

We investigate the effect of oxygen vacancies and hydrogen dopants at the surface and inside slabs of LaAlO3, SrTiO3, and LaAlO3/SrTiO3 heterostructures on the electronic properties by means of electronic structure calculations as based on…

Strongly Correlated Electrons · Physics 2019-05-03 I. I. Piyanzina , V. Eyert , Yu. V. Lysogorskiy , D. A. Tayurskii , T. Kopp

Oxygen greatly affects the mechanical properties of titanium. In addition, dislocations and twin boundaries influence the plastics deformation of hcp metals. As part of a systematic study of defects interactions in Ti, we investigate the…

Materials Science · Physics 2014-03-13 M. Ghazisaeidi , D. R. Trinkle

We fabricated silicon metal-oxide-semiconductor field effect transistors where an additional sodium-doped layer was incorporated into the oxide to create potential fluctuations at the Si-SiO2 interface. The amplitude of these fluctuations…

Strongly Correlated Electrons · Physics 2010-10-12 T. Ferrus , R. George , C. H. W. Barnes , M. Pepper

Silicon has long been synonymous with semiconductor technology. This unique role is due largely to the remarkable properties of the Si-SiO_2 interface, especially the (001)-oriented interface used in most devices. Although Si is crystalline…

Materials Science · Physics 2009-10-31 Yuhai Tu , J. Tersoff

Intercalation has proven to be a powerful tool for tailoring the electronic properties of freestanding graphene layers as well as for stabilizing the intercalated material in a two-dimensional configuration. This work examines Si…

We study the chemical nature of the bonding of an oxide layer to the parent metal. In order to disentangle chemical effects from strain/misfit, Ti(10$\bar{1}$0)/TiO$_{2}$(100) interface has been chosen. We use the density functional…

Materials Science · Physics 2012-12-10 Linggang Zhu , Graeme J. Ackland

Silicon Carbide (SiC) is a typical material for third-generation semiconductor. The thermal boundary resistance (TBR) of 4H-SiC/SiO2 interface, was investigated by both experimental measurements and theoretical calculations. The structure…

Applied Physics · Physics 2025-02-06 Shichen Deng , Chengdi Xiao , Jiale Yuan , Dengke Ma , Junhui Li , Nuo Yang , Hu He

Charge redistribution across heterojunctions has long been utilized to induce functional response in materials systems. Here we examine how the composition of the terminating surface affects charge transfer across a heterojunction…

Materials Science · Physics 2023-03-28 M. Chrysler , J. Gabel , T. -L. Lee , Z. Zhu , T. C. Kaspar , P. V. Sushko , S. A. Chambers , J. H. Ngai

The linear band dispersion of graphene's bands near the Fermi level gives rise to its unique electronic properties, such as a giant carrier mobility, and this has triggered extensive research in applications, such as graphene field-effect…

We report that annealing in low-oxygen-partial-pressure (low-p$_{\rm O2}$) ambient is effective in reducing the interface state density (D$_{\rm IT}$) at a SiC (0001)/SiO$_{\rm 2}$ interface near the conduction band edge (E$_{\rm C}$) of…

Materials Science · Physics 2019-02-19 Takuma Kobayashi , Keita Tachiki , Koji Ito , Tsunenobu Kimoto

The ability to follow Moore's Law has been the basis of the tremendous success of the semiconductor industry in the past decades. To date, the greatest challenge for device scaling is the required replacement of silicon dioxide-based gate…

Materials Science · Physics 2007-05-23 Clemens J. Foerst , Christopher R. Ashman , Karlheinz Schwarz , Peter E. Bloechl

Color centers in silicon carbide (SiC) have demonstrated significant promise for quantum information processing. However, the undesirable ionization process that occurs during optical manipulation frequently causes fluctuations in the…

This study presents a comprehensive investigation of chemical, structural, and magnetic properties of Ti/Ni multilayer systems with period thicknesses of 4 nm and 10 nm. Particular attention was paid to the characterization of the…

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

Materials Science · Physics 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser