Related papers: On-line Survival Analysis of Power Electronic Conv…
Transformer life assessment and failure diagnostics have always been important problems for electric utility companies. Ambient temperature and load profile are the main factors which affect aging of the transformer insulation, and…
This paper deals with asymptotic expressions of the Mean Time To Failure (MTTF) and higher moments for large, recursive, and non-repairable systems in the context of two-terminal reliability. Our aim is to extend the well-known results of…
The Meantime to Failure is a statistic used to determine how much time a system spends to enter one of its absorption states. This statistic can be used in most areas of knowledge. In engineering, for example, can be used as a measure of…
Semiconductors are widely used in various applications and critical infrastructures. These devices have specified lifetimes and quality targets that manufacturers must achieve. Lifetime estimation is conducted through accelerated stress…
In this work we propose a stochastic model for estimating the occurrence of crack initiations on the surface of metallic specimens in fatigue problems that can be applied to a general class of geometries. The stochastic model is based on…
Survival analysis, or time-to-event analysis, is an important and widespread problem in healthcare research. Medical research has traditionally relied on Cox models for survival analysis, due to their simplicity and interpretability. Cox…
If a Micro Processor Unit (MPU) receives an external electric signal as noise, the system function will freeze or malfunction easily. A new resilience strategy is implemented in order to reset the MPU automatically and stop the MPU from…
Experience shows that semiconductor switches in power electronics systems are the most vulnerable components. One of the most common ways to solve this reliability challenge is component-level redundant design. There are four possible…
Accurately predicting the lifespan of critical device components is essential for maintenance planning and production optimization, making it a topic of significant interest in both academia and industry. In this work, we investigate the…
Electromigration phenomena in metallic lines are studied by using a biased resistor network model. The void formation induced by the electron wind is simulated by a stochastic process of resistor breaking, while the growth of mechanical…
Electricity systems are experiencing increased effects of randomness and variability due to emerging stochastic assets. The increased effects introduce new uncertainties into power systems that can impact system operability and reliability.…
This paper introduces a simple framework for accurately predicting the fatigue lifetime of notched components by employing various machine learning algorithms applied to a wide range of materials, loading conditions, notch geometries, and…
We present a generalised phase field formulation for predicting high-cycle fatigue in metals. Different fatigue degradation functions are presented, together with new damage accumulation strategies, to account for (i) a typical S-N curve…
Power loss estimation is an indispensable procedure to conduct lifetime prediction for power semiconductor device. The previous studies successfully perform steady-state power loss estimation for different applications, but which may be…
The Cox model, which remains as the first choice in analyzing time-to-event data even for large datasets, relies on the proportional hazards (PH) assumption. When survival data arrive sequentially in chunks, a fast and minimally storage…
This paper describes the use of survival analysis and simulation to model the lifetime of high voltage instrument transformers in the Dutch transmission sys-tem. To represent asset aging, the non-parametric Kaplan-Meier method is used to…
Survival analysis/time-to-event models are extremely useful as they can help companies predict when a customer will buy a product, churn or default on a loan, and therefore help them improve their ROI. In this paper, we introduce a new…
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately predicting the time-to-failure of integrated circuits (IC)…
Desirability Of Outcome Ranking (DOOR) methodology accounts for problems that conventional benefit:risk analyses in clinical trials ignore, such as competing risks and the trade-off relationship between efficacy and toxicity. DOOR levels…
The analysis of standardized low cycle fatigue (LCF) experiments shows that the failure times widely scatter. Furthermore, mechanical components often fail before the deterministic failure time is reached. A possibility to overcome these…