Related papers: Versatile AFM setup combined with micro-focused X-…
Dark Field X-ray Microscopy (DFXM) is a full-field imaging technique for non-destructive 3D mapping of orientation and strain in crystalline elements. The new DFXM beamline at ID03, developed as part of the ESRF Phase II Upgrade Project…
Synchrotron light sources and X-ray free-electron laser (FEL) facilities are unique tools providing extremely brilliant X-rays that allow the observation of matter with atomic spatial resolution. On the one hand, synchrotron light sources…
Using the China Spallation Neutron Source (CSNS) linac as the injector, a 500 MeV proton synchrotron is proposed for multidisciplinary application, such as biology, material and proton therapy. The synchrotron will deliver proton beam with…
Acoustics-based techniques are investigated to focus and bunch nanoparticle beams. This allows to overcome the prominent problem of the longitudinal and transverse mismatch of particle stream and x-ray beam in single-particle/single…
Recent progress in nanofabrication and additive manufacturing have facilitated the building of nanometer-scale three-dimensional structures, that promise to lead to an emergence of new functionalities within a number of fields, compared to…
Precise control of particle positioning is desirable in many optical propulsion and sorting applications. Here, we develop an integrated platform for particle manipulation consisting of a combined optical nanofibre and optical tweezers…
We review recent efforts to detect small numbers of nuclear spins using magnetic resonance force microscopy. Magnetic resonance force microscopy (MRFM) is a scanning probe technique that relies on the mechanical measurement of the weak…
Adaptive optics methods have long been used to perform complex light shaping at the output of a multimode fiber (MMF), with the specific aim of controlling the emitted beam in the near-field. Gaining control of other emission properties,…
X-ray absorption fine structure (XAFS) and x-ray emission spectroscopy (XES) are advanced x-ray spectroscopies that impact a wide range of disciplines. However, unlike the majority of other spectroscopic methods, XAFS and XES are…
A novel interferometric method is presented for the measurement of the absolute energy of electron beams. In the year 2016, a pioneering experiment was performed using a 195 MeV beam of the Mainz Microtron (MAMI). The experimental setup…
In the field of beam physics, two frontier topics have taken center stage due to their potential to enable new approaches to discovery in a wide swath of science. These areas are: advanced, high gradient acceleration techniques, and x-ray…
Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…
A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as…
We introduce an in-situ characterization method of resists used for e-beam lithography. The technique is based on the application of an atomic force microscope which is directly mounted below the cathode of an electron-beam lithography…
Understanding the nanoscale carrier dynamics induced by light excitation is the key to unlocking futuristic devices and innovative functionalities in advanced materials. Optical pump-probe scanning tunneling microscopy (OPP-STM) has opened…
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…
Effective collecting area, angular resolution, field of view and energy response are fundamental attributes of X-ray telescopes. The performance of state-of-the-art telescopes is currently restricted by Wolter optics, especially for hard…
A synchrotron radiation beamline in the photon energy range of 18 - 240 eV and an electron spectroscopy end station have been constructed at the 3 GeV Diamond Light Source storage ring. The instrument features a variable polarisation…
Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…