Related papers: Quantitative Measurements of Electromechanical Res…
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
An extremely sensitive temperature measurement MEMS device is developed based on the principle of structural deflection in a bi-material cantilever caused by a difference in thermal expansion coefficients. A dual-beam asymmetrical geometry…
Herein, an atomic norm based method for accurately estimating the location and orientation of a target from millimeter-wave multi-input-multi-output (MIMO) orthogonal frequency-division multiplexing (OFDM) signals is presented. A novel…
A promising technique for measuring single electron spins is magnetic resonance force microscopy (MRFM), in which a microcantilever with a permanent magnetic tip is resonantly driven by a single oscillating spin. If the quality factor of…
Because of the unlimited range of state space, orbital angular momentum (OAM) as a new degree of freedom of light has attracted great attention in optical communication field. Recently there are a number of researches applying deep learning…
Atomic force microscopy (AFM) enables nanoscale characterization and has been widely applied to a broad range of systems. Over the past two decades, advances in high-speed AFM have enabled not only the imaging of static structures but also…
Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…
Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf,…
Magnetic Resonance Force Microscopy (MRFM) is an emergent technology for measuring spin-induced attonewton forces using a micromachined cantilever. In the interrupted Oscillating Cantilever-driven Adiabatic Reversal (iOSCAR) method, small…
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to…
Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…
Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid-liquid interfaces. In many cases, these processes are spatially…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
Optically pumped atomic magnetometers (OPAMs) offer high sensitivity at room temperature and are increasingly considered for portable magnetic sensing in geomagnetic-field environments. Here we report a handheld-scale, single-beam scalar…
Force-distance curve experiments are commonly performed in Atomic Force Microscopy (AFM) to obtain the viscoelastic characteristics of materials, such as the storage and loss moduli or compliances. The classic methods used to obtain these…
We present an alternative approach to pump-probe spectroscopy for measuring fast charge dynamics with an atomic force microscope (AFM). Our approach is based on coherent multifrequency lock-in measurement of the intermodulation between a…
We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not…
We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…
Recent advances in the fabrication of microelectromechanical systems (MEMS) and their evolution into nanoelectromechanical systems (NEMS) have allowed researchers to measure extremely small forces, masses, and displacements. In particular,…