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We report on very high enhancement of thin layer's absorption through band-engineering of a photonic crystal structure. We realized amorphous silicon (aSi) photonic crystals, where slow light modes improve absorption efficiency. We show…

Atom probe tomography data is composed of a list of coordinates of the reconstructed atoms in the probed volume. The elemental identity of each atom is derived from time-of-flight mass spectrometry, with no local energetic or chemical…

Modern data science relies on data analytic pipelines to organize interdependent computational steps. Such analytic pipelines often involve different algorithms across multiple steps, each with its own hyperparameters. To achieve the best…

Machine Learning · Computer Science 2016-06-27 Yuyu Zhang , Mohammad Taha Bahadori , Hang Su , Jimeng Sun

A simple electronic experiment with a field effect transistor type microstructure is suggested. The thin superconductor layer is the source-drain channel of the layered structure where an AC current is applied. It is necessary to measure…

Superconductivity · Physics 2009-09-29 Todor Mishonov , Martin Stoev

Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…

Materials Science · Physics 2025-06-17 Steven R. Spurgeon

X-ray fluorescence (XRF) analysis is a widely applied technique for the quantitative analysis of thin films up to the $\mu$m scale because of its non-destructive nature and because it is easily automated. When low uncertainties of the…

Materials Science · Physics 2020-10-13 André Wählisch , Cornelia Streeck , Philipp Hönicke , Burkhard Beckhoff

When the thickness of the layer is smaller than the electrons mean free path, the morphology affects the conductivity directly based on the layer thickness. This issue provides basis in order to estimate the thickness of the layer by…

Mesoscale and Nanoscale Physics · Physics 2015-06-16 M. Jannesar , G. R. Jafari , S. Vasheghani Farahani , S. Moradi

It is shown that for thin metallic films thickness of which does not exceed thickness of skin layer, the problem allows analytical solution. In the field of resonant frequencies the analysis of dependence of coefficients of transmission,…

Mathematical Physics · Physics 2015-03-17 A. V. Latyshev , A. A. Yushkanov

Fundamental differences between materials originate from the unique nature of their constituent chemical elements. Before specific differences emerge according to the precise ratios of elements in a given crystal structure, a material can…

Bayesian inference allows the transparent communication of uncertainty in material flow analyses (MFAs), and a systematic update of uncertainty as new data become available. However, the method is undermined by the difficultly of defining…

Applications · Statistics 2024-03-28 Jiayuan Dong , Jiankan Liao , Xun Huan , Daniel Cooper

Zeolites, as representative porous materials, possess intricate three-dimensional frameworks that endow them with high surface areas and remarkable catalytic properties. There are a few factors that give a huge influence on the catalytic…

Materials Science · Physics 2025-04-25 Enci Zhang , Zhuoya Dong , Xubin Han , Jianhua Zhang , Yanhang Ma , Huaidong Jiang

Two-dimensional (2D) crystals are attracting growing interest in various research fields such as engineering, physics, chemistry, pharmacy and biology owing to their low dimensionality and dramatic change of properties compared to the bulk…

In many optical systems, including metal films, dielectric reflectors, and photonic crystals, electromagnetic waves can experience evanescent decay. The spatial length scale of such decay defines the penetration depth. The ability to reduce…

Thin film technology is a most relevant field in terms of number of different applications and, even more, in how widespread the use of the technology is. Virtually all optical devices involving light beams or with imaging capabilities…

Physics Education · Physics 2022-06-28 Salvador Bosch , Josep Ferré-Borrull , Jordi Sancho-Parramon

Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…

Materials Science · Physics 2021-10-06 Jian-Min Zuo , Renliang Yuan , Yu-Tsun Shao , Haw-Wen Hsiao , Saran Pidaparthy , Yang Hu , Qun Yang , Jiong Zhang

The presence of gas pores in metal feedstock powder for additive manufacturing greatly affects the final AM product. Since current porosity analysis often involves lengthy X-ray computed tomography (XCT) scans with a full rotation around…

Computer Vision and Pattern Recognition · Computer Science 2024-08-06 Andreas Bjerregaard , David Schumacher , Jon Sporring

X-ray absorption fine structure (XAFS) and x-ray emission spectroscopy (XES) are advanced x-ray spectroscopies that impact a wide range of disciplines. However, unlike the majority of other spectroscopic methods, XAFS and XES are…

A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…

Optics · Physics 2010-06-14 V. Berejnov , D. Li

Facial biometrics has been recently received tremendous attention as a convenient replacement for traditional authentication systems. Consequently, detecting malicious attempts has found great significance, leading to extensive studies in…

Computer Vision and Pattern Recognition · Computer Science 2022-01-03 Arian Sabaghi , Marzieh Oghbaie , Kooshan Hashemifard , Mohammad Akbari

MPC (Magneto-Photonic Crystal) Optimisation is a feature-rich Windows software application designed to enable researchers to analyze the optical and magneto-optical spectral properties of multilayers containing gyrotropic constituents. A…

Applied Physics · Physics 2019-05-03 M. Vasiliev , K. Alameh , M. Nur-E-Alam
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