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With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the…
The NLC extraction line provides a secondary focal point with a low beta function and 2 cm dispersion which can be used for measurement of the beam energy spectrum. In this study, tracking simulations were performed to transport the 0.5 TeV…
The accurate modeling of reflection coefficients is pivotal for developing reliable channel models in emerging terahertz (THz) communications. This study establishes a 300$\sim$400 GHz channel measurement platform to measure the reflection…
A new experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the…
The precision measurement of diffusion coefficient of solution is very important for the clear understanding of material transfer and interaction between the materials. But the high precision measurement of diffusion coefficient is very…
Recently it has been proposed that a planar slab of material, for which both the permittivity and permeability have the values of -1, could bring not only the propagating fields associated with a source to a focus, but could also refocus…
Line segment detection is a fundamental low-level task in computer vision, and improvements in this task can impact more advanced methods that depend on it. Most new methods developed for line segment detection are based on Convolutional…
Momentum-resolved scanning transmission electron microscopy (MRSTEM) is a powerful phase-contrast technique that can map lateral magnetic and electric fields ranging from the micrometer to the subatomic scale. Resolving fields ranging from…
Power spectral density measurements of any sampled signal are typically restricted by both acquisition rate and frequency response limitations of instruments, which can be particularly prohibitive for video-based measurements. We have…
Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…
For over a century diffraction theory has been thought to limit the resolution of focusing and imaging in the optical domain. The size of the smallest spot achievable is inversely proportional to the range of spatial wavevectors available.…
Neutral helium atom microscopy is a novel microscopy technique that offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot…
Using a high energy electron beam for the imaging of high density matter with both high spatial-temporal and areal density resolution under extreme states of temperature and pressure is one of the critical challenges in high energy density…
High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…
The LUXE (Laser Und XFEL Experiment) aims at studying high-field QED in electron-laser and photon-laser interactions, with the 16.5 GeV electron beam of the European XFEL and a laser beam with a power of up to 350 TW. The experiment will…
Computational spectrometers have mobile application potential, such as on-site detection and self-diagnosis, by offering compact size, fast operation time, high resolution, wide working range, and low-cost production. Although these…
High-precision spectrophotometry is highly desirable in detecting and characterizing close-in extrasolar planets to learn about their makeup and temperature. For such a goal, a modest-size telescope with a simple low-resolution…
We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to measure the (sub-pixel) difference in projection parameters…
In the last two decades, Fresnel diffraction (FD) of a plane wave from phase steps has been systematically studied and applied for precise measurements of light wavelength, and height and refractive index of the step. In this study we…
This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (non-iterative) and…