Related papers: Determining surface properties with bimodal and mu…
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
Stepped well-ordered semiconductor surfaces are important as nanotemplates for the fabrication of one-dimensional nanostructures which are candidates of intriguing electronic properties. Therefore a detailed understanding of the underlying…
We deal with the photoacoustic imaging modality using dielectric nanoparticles as contrast agents. Exciting the heterogeneous tissue, localized in a bounded domain $\Omega$, with an electromagnetic wave, at a given incident frequency,…
This work is a theoretical investigation of the stability of the non-linear behavior of an oscillating tip-cantilever system used in dynamic force microscopy. Stability criterions are derived that may help to a better understanding of the…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…
Shape effects in magnetic particles are widely studied, because of the ability of the shape and the size to control the parameters of a sample during its production. Experiments with nano-sized samples show that the shape can affect also…
Optical beam deflection is a popular method to measure the deformation of micromechanical devices. As it measures mostly a local slope, its sensitivity depends on the location and size of the optical spot. We present a method to evaluate…
Surface phenomena are increasingly becoming important in exploring nanoscale materials growth and characterization. Consequently, the need for atomistic based simulations is increasing. Nevertheless, relying entirely on quantum mechanical…
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring…
We discuss the Brownian thermal noise which affects the cantilever dynamics of a dAFM (dynamic atomic force microscope), both when it works in air and in presence of water. Our scope is to accurately describe the cantilever dynamics, and to…
Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in…
We present an alternative approach to pump-probe spectroscopy for measuring fast charge dynamics with an atomic force microscope (AFM). Our approach is based on coherent multifrequency lock-in measurement of the intermodulation between a…
In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexural modes (sum amplitude). We show atomically resolved…
The effect of bias voltages on the statistical properties of rough surfaces has been studied using atomic force microscopy technique and its stochastic analysis. We have characterized the complexity of the height fluctuation of a rough…
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…
Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning imperfections, and tip-sample interactions. To address this…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…