Related papers: High Speed Friction Microscopy and Nanoscale Frict…
Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…
As consumer devices become increasingly intelligent and interconnected, efficient data transfer solutions for machine tasks have become essential. This paper presents an overview of the latest Feature Coding for Machines (FCM) standard,…
The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data…
Fuzzy C-Means (FCM) is a widely used clustering method. However, FCM and its many accelerated variants have low efficiency in the mid-to-late stage of the clustering process. In this stage, all samples are involved in the update of their…
Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes.…
We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
The frictional properties of individual carbon nanotubes (CNTs) are studied by sliding an atomic force microscopy tip across and along its principle axis. This direction-dependent frictional behavior is found to correlate strongly with the…
In this work we develop theoretical and numerical methods of calculation of a dynamic friction coefficient. The theoretical method is based on an adiabatic approximation which allows us to express the dynamic friction coefficient in terms…
We have studied the low speed fracture regime for different glassy materials with variable but controlled length scales of heterogeneity in a carefully mastered surrounding atmosphere. By using optical and atomic force (AFM) microscopy…
We report here that atomic force microscope (AFM) in frictional force mode can be used to detect onset of chain scission and crosslinking in polymeric and macromolecular samples upon irradiation. A systematic investigation to detect chain…
The sliding of a solid object on a solid substrate requires a shear force that is larger than the maximum static friction force. It is commonly believed that the maximum static friction force is proportional to the loading force and does…
Current nanofriction experiments on crystals, both tip-on-surface and surface-on-surface, provide force traces as their sole output, typically exhibiting atomic size stick-slip oscillations. Physically interpreting these traces is a task…
The increasing use of two-dimensional (2D) materials in nanoelectronics demands robust metrology techniques for electrical characterization, especially for large-scale production. While atomic force microscopy (AFM) techniques like…
Atomistic simulations are powerful tools for investigating tribological phenomena at a fundamental level; however, simulating a tribological system remains challenging due to the multiscale nature of frictional processes. Recently, we…
Force distance curves (FCs) are among the most direct measurements performed in atomic force microscopy (AFM), yet their information content is often reduced by filtering and quasi-static interpretation. Here, enabled by a new…
Friction is ubiquitous in daily life, from nanoscale machines to large engineering components. By probing the intricate interplay between system parameters and frictional behavior, scientists seek to unveil the underlying mechanisms that…