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We report the destabilization of the charge ordered insulating (COI) state in a localized region of Pr_0.63Ca_0.37MnO_3 single crystal by current injection using a scanning tunneling microscope tip. This leads to controlled phase separation…

Materials Science · Physics 2007-10-06 Sohini Kar , A. K. Raychaudhuri

We propose a theoretical model of friction under electrochemical conditions focusing on the interaction of a force microscope tip with adsorbed polar molecules of which the orientation depends on the applied electric field. We demonstrate…

Mesoscale and Nanoscale Physics · Physics 2014-02-19 A. S. de Wijn , A. Fasolino , A. Filippov , M. Urbakh

The control and observation of reactants forming a chemical bond at the single-molecule level is a longstanding challenge in quantum physics and chemistry. Using a single CO molecule adsorbed at the apex of an atomic force microscope tip…

Mesoscale and Nanoscale Physics · Physics 2021-04-07 Nicolas Néel , Jörg Kröger

We introduce an orbital dependent electron tunneling model and implement it within the atom superposition approach for simulating scanning tunneling microscopy (STM) and spectroscopy (STS). Applying our method, we analyze the convergence…

Materials Science · Physics 2012-12-20 Krisztián Palotás , Gábor Mándi , László Szunyogh

General energy approaches have been applied to study the single-domain polarization reversal induced by the voltage-modulated Atomic Force Microscopy (AFM) in ferroelectric single crystals and thin films. Topographic analysis of energy…

Materials Science · Physics 2009-11-10 A. Yu. Emelyanov

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

A trapped atom interferometer involving state-selective adiabatic potentials with two microwave frequencies on a chip is proposed. We show that this configuration provides a way to achieve a high degree of symmetry between the two arms of…

In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…

Mathematical Physics · Physics 2023-06-06 Alemdar Hasanov , Onur Baysal , Alexandre Kawano

In the atomic force microscope, the nanoscale force topography of even complex surface superstructures is extracted by the changing vibration frequency of a scanning tip. An alternative dissipation topography with similar or even better…

Mesoscale and Nanoscale Physics · Physics 2010-09-08 Carlotta Negri , Nicola Manini , Andrea Vanossi , Giuseppe E. Santoro , Erio Tosatti

We discuss how variations in the scanning tunneling microscope (STM) tip, whether unintentional or intentional, can lead to changes in topographic images and dI/dV spectra. We consider the possibility of utilizing functionalized tips in…

Superconductivity · Physics 2015-05-28 Ilpo Suominen , Jouko Nieminen , R. S. Markiewicz , A. Bansil

We investigate electroluminescence of single molecular emitters on NaCl on Ag(111) and Au(111) with submolecular resolution in a low-temperature scanning probe microscope with tunneling current, atomic force and light detection…

Mesoscale and Nanoscale Physics · Physics 2020-01-08 Jiří Doležal , Pablo Merino , Jesus Redondo , Lukáš Ondič , Aleš Cahlík , Martin Švec

Single electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were…

Disentangling the relationship between the insulating state with a charge gap and the magnetic order in an antiferromagnetic (AF) Mott insulator remains difficult due to inherent phase separation as the Mott state is perturbed. Measuring…

Strongly Correlated Electrons · Physics 2022-03-17 He Zhao , Sujit Manna , Zach Porter , Xiang Chen , Andrew Uzdejczyk , Jagadeesh Moodera , Ziqiang Wang , Stephen D. Wilson , Ilija Zeljkovic

Atomic force microscopy using a magnetic tip is a promising tool for investigating conductivity on the nano-scale. By the oscillating magnetic tip eddy currents are induced in the conducting parts of the sample which can be detected in the…

Atomic Physics · Physics 2009-11-13 Tino Roll , Marion Meier , Ulrich Fischer , Marika Schleberger

The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits…

Mesoscale and Nanoscale Physics · Physics 2015-11-24 Mario S. Rodrigues , Luca Costa , Joel Chevrier , Fabio Comin

Approaching a two-component tip made of a superconductor (S) and a ferromagnet (F) from a magnetic sample allows for two distinct tunneling processes between the ferromagnets, through S: i) Charge and spin are conserved; ii) Charge and spin…

Mesoscale and Nanoscale Physics · Physics 2009-11-07 D. Feinberg , G. Deutscher

By placing the biased tip of an atomic force microscope at a specific position above a semiconductor surface we can locally shape the potential landscape. Inducing a local repulsive potential in a two dimensional electron gas near a quantum…

Mesoscale and Nanoscale Physics · Physics 2014-07-03 N. Pascher , F. Timpu , C. Rossler , T. Ihn , K. Ensslin , C. Reichel , W. Wegscheider

We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate. The domain contrast can…

Materials Science · Physics 2009-11-13 T. Jungk , A. Hoffmann , E. Soergel

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe.…

Statistical Mechanics · Physics 2007-05-23 T. Gericke , C. Utfeld , N. Hommerstad , H. Ott

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions…

Materials Science · Physics 2016-08-14 F. Johann , Á. Hoffmann , E. Soergel
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