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The local hysteresis loop obtained by switching spectroscopy piezoresponse force microscopy (SS-PFM) is usually regarded as a typical signature of ferroelectric switching. However, such hysteresis loops were also observed in a broad variety…

Mesoscale and Nanoscale Physics · Physics 2014-10-31 Hongchen Miao , Chi Tan , Xilong Zhou , Xiaoyong Wei , Faxin Li

Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…

Materials Science · Physics 2018-04-26 Junxi Yu , Ehsan Nasr Esfahani , Qingfeng Zhu , Dongliang Shan , Tingting Jia , Shuhong Xie , Jiangyu Li

Piezoresponse force microscopy (PFM) is a powerful tool for probing nanometer-scale ferroelectric and piezoelectric properties. Hysteretic switching of the phase and amplitude of the PFM response are believed to be the hallmark of…

Materials Science · Physics 2016-10-04 Shilpa Sanwlani , Mohammad Balal , Shubhra Jyotsna , Goutam Sheet

Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction…

Piezoresponse force microscopy (PFM) has been extensively utilized as a versatile and an indispensable tool to understand and analyze nanoscale ferro- /piezoelectric properties by detecting the local electromechanical response on a sample…

Applied Physics · Physics 2020-04-29 Huimin Qiao , Owoong Kwon , Yunseok Kim

Electromechanical hysteresis loop measurements in Piezoresponse Force Microscopy (Piezoresponse Force Spectroscopy) have emerged as a powerful technique for probing ferroelectric switching behavior on the nanoscale. Interpretation of PFS…

Materials Science · Physics 2009-11-11 Anna N. Morozovska , Eugene A. Eliseev , Sergei V. Kalinin

The thermodynamics and kinetics of tip-induced polarization switching in Piezoresponse Force Microscopy in the presence of surface charge defects is studied using the combination of analytical and numerical techniques. The signature of the…

Antimony sulfide is an emerging phase change material for optical and electrical memory and computation elements. It has additionally been reported as a ferroelectric, with recent evidence from hysteresis in piezoresponse force microscopy.…

Piezoresponse Force Microscopy (PFM) and Electrochemical Strain Microscopy (ESM) are two related techniques that have had considerable success in nano-scale probing of functional material properties. Both measure the strain of the sample in…

Mesoscale and Nanoscale Physics · Physics 2015-06-18 Roger Proksch

Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful technique for probing highly localized switching behavior and the role of microstructure and defects on switching. The application of a dc bias to a scanning probe microscope…

Piezoresponse Force Microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, the intensive study of conventional PFM has…

Applied Physics · Physics 2021-02-16 Qibin Zeng , Hongli Wang , Qicheng Huang , Zhen Fan , Kaiyang Zeng

Description of domains switching processes in crystalline ferroelectrics by means of relaxation type equations with account of variable external electric field is proposed. Exact solution of these equations in closed analytical form at…

Materials Science · Physics 2014-07-04 A. Yu. Zakharov , M. I. Bichurin

Antiferroelectrics exhibit unique double-hysteresis polarization loops, which have garnered significant attention due to their potential applications such as energy storage, electromechanical transduction, as well as synapse devices.…

Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful tool for probing polarization dynamics on the nanoscale. Application of a dc bias to a nanoscale probe in contact with a ferroelectric surface results in the nucleation and…

Materials Science · Physics 2007-05-23 Anna N. Morozovska , Sergei V. Kalinin , Eugene A. Eliseev , Sergei V. Svechnikov

Piezoresponse force microscopy (PFM) has been widely used for nanoscale analysis of piezoelectric properties and ferroelectric domains. Although PFM is useful because of its simple and nondestructive features, PFM measurements can be…

Applied Physics · Physics 2023-05-09 Jaegyu Kim , Seongwoo Cho , Jiwon Yeom , Seongmun Eom , Seungbum Hong

Nanoscale polarization switching in ferroelectric materials by Piezoresponse Force Microscopy (PFM) in weak and strong indentation limits is analyzed using exact solutions for electrostatic and coupled electroelastic fields below the tip.…

Materials Science · Physics 2009-11-10 Sergei V. Kalinin , A. Gruverman , J. Shin , A. P. Baddorf , E. Karapetian , M. Kachanov

We have proposed the phenomenological description of dielectric hysteresis loops in ferroelectric semiconductors with charged defects and prevailing extrinsic conductivity. Exactly we have modified Landau-Ginsburg approach and shown that…

Materials Science · Physics 2009-11-10 Anna N. Morozovska , Eugene A. Eliseev

Using Langevin Dynamics simulations, we study a simple model of interacting-polymer under a periodic force. The force-extension curve strongly depends on the magnitude of the amplitude $(F)$ and the frequency ($\nu$) of the applied force.…

Soft Condensed Matter · Physics 2013-10-01 Rakesh Kumar Mishra , Garima Mishra , Debaprasad Giri , Sanjay Kumar

With the advent of increasingly elaborate experimental techniques in physics, chemistry and materials sciences, measured data are becoming bigger and more complex. The observables are typically a function of several stimuli resulting in…

Ferroelectric switching in BiFeO$_3$ multiferroic thin films with intrinsic ``stripe-like'' and ``bubble-like'' polydomain configurations was studied by piezoresponse force microscopy. Using the local electric field applied by a scanning…

Materials Science · Physics 2009-07-28 H. Béa , M. Bibes , A. Barthélémy , P. Paruch
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