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Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}),…
Pushing the limits in temporal resolution for transmission electron microscopy (TEM) requires a revolutionary change in the electron source technology. In this paper we study the possibility of employing a radiofrequency photoinjector as…
Aberration-corrected environmental transmission electron microscopy (ETEM) enables atomic-resolution imaging of dynamic catalytic processes. Correlating atomic-scale structural changes with reaction products detected by mass spectrometry…
The Spectral Energy Distribution (SED) mode of the Multiband Imaging Photometer for Spitzer (MIPS) Space Telescope provides low-spectral resolution (R ~ 15-25) spectroscopy in the far infrared using the MIPS 70 um detector. A reflective…
We present an absolute extraction method of optical constants of metal from the measured reflection electron energy loss (REELS) spectra by using the recently developed reverse Monte Carlo (RMC) technique. The method is based on a direct…
Electron energy loss spectra have been measured on hexagonal boron nitride single crystals employing a novel electron energy loss spectroscopic set-up composed by an electron microscope equipped with a monochromator and an in-column filter.…
The HERMES high-resolution spectrograph project aims at exploiting the specific potential of small but flexible telescopes in observational astrophysics. The optimised optical design of the spectrograph is based on the well-proven concept…
Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg…
Spectroscopy requires high-precision wavelength discrimination but typically requires bulky, alignment-sensitive instrumentation. To address this, we present a compact computational spectrometer built from a single germanium PN photodiode.…
The photoelectron spectroscopy beamline at National Synchrotron Radiation Laboratory (NSRL) is equipped with a spherical grating monochromator with the included angle of 174 deg. Three gratings with line density of 200, 700 and 1200…
Photometric constraint is indispensable for self-supervised monocular depth estimation. It involves warping a source image onto a target view using estimated depth&pose, and then minimizing the difference between the warped and target…
Point-spread function of the probe forming optics ($PSF_{optics} $) is reported for the first time in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, the electron probe information is lost as the…
Transition Edge Sensor (TES) spectrometers for hard X-ray beamline science will enable improved X-ray emission and absorption spectroscopy in the information-rich 2 to 20 keV energy range. We are building a TES-based instrument for the…
Due to their radiation hardness, kilohertz frame rates, and high dynamic range, hybrid pixel detectors have recently expanded their application range to electron diffraction and recently also electron imaging. However, these detectors…
Synchrotron based photoemission electron microscopy with energy filter combines real space imaging with microprobe diffraction ($\mu$-ARPES), giving access to the local electronic structure of laterally inhomogeneous materials. We present…
Ultrafast electron-photon spectroscopy in electron microscopes commonly requires ultrafast laser setups. Photoemission from an engineered electron source is used to generate pulsed electrons, interacting with a sample that is excited by the…
Electron matter interactions in electron microscopy produce both elastic and inelastic scattering, forming the basis for imaging and spectroscopy. However, the integration of electron energy loss spectroscopy (EELS) with 4D-STEM and…
Fine structure analysis of core electron excitation spectra is a cornerstone characterization technique across the physical sciences. Spectra are most commonly measured with synchrotron radiation and X-ray spot sizes on the {\mu}m to mm…
General expressions of the electron yield in (^{57})Fe integral conversion electron M\"ossbauer spectroscopy were derived depending on the angle of incidence of the (\gamma)-rays, on the source polarization and on the isotopic abundance of…
*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized…