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An interferometric method is implemented in order to accurately assess the thermal fluctuations of a micro-cantilever sensor in liquid environments. The power spectrum density (PSD) of thermal fluctuations together with Sader's model of the…

Soft Condensed Matter · Physics 2015-11-11 Felipe Aguilar Sandoval , Manuel Sepúlveda , Ludovic Bellon , Francisco Melo

Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…

Biological Physics · Physics 2014-05-01 Luca Costa , Mario S Rodrigues , Emily Newman , Chloe Zubieta , Joel Chevrier , Fabio Comin

This article describes how a frequency modulation AFM using a hanging fiber force probe made from a quartz tuning fork provides local measurements on liquid-liquid interfaces. After detailing the manufacture and calibration of the force…

Mesoscale and Nanoscale Physics · Physics 2022-05-23 Matthieu Rocheron , Christian Curtil , Hubert R. Klein

Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…

Instrumentation and Detectors · Physics 2015-05-14 Sebastian Hoof , Nitya Nand Gosvami , Bart W. Hoogenboom

We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…

Soft Condensed Matter · Physics 2017-02-23 Sebastien Kosgodagan Acharige , Justine Laurent , Audrey Steinberger

An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…

Mesoscale and Nanoscale Physics · Physics 2015-05-22 Aleks Labuda , Roger Proksch

We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

Optics · Physics 2015-06-05 Yuxiang Liu , Houxun Miao , Vladimir Aksyuk , Kartik Srinivasan

The mechanical properties of collagen fibrils depend on the amount and the distribution of water molecules within the fibrils. Here, we use atomic force microscopy (AFM) to study the effect of hydration on the viscoelastic properties of…

Soft Condensed Matter · Physics 2019-10-03 Manuel R. Uhlig , Robert Magerle

Optical beam deflection is a popular method to measure the deformation of micromechanical devices. As it measures mostly a local slope, its sensitivity depends on the location and size of the optical spot. We present a method to evaluate…

Instrumentation and Detectors · Physics 2024-07-25 Alex Fontana , Ludovic Bellon

The description of hydrodynamic interactions between a particle and the surrounding liquid, down to the nanometer scale, is of primary importance since confined liquids are ubiquitous in many natural and technological situations. In this…

Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…

Soft Condensed Matter · Physics 2007-05-23 Davood Norouzi , Martin Michael Mueller , Markus Deserno

Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…

Mesoscale and Nanoscale Physics · Physics 2023-08-01 Alba R. Piacenti , Casey Adam , Nicholas Hawkins , Ryan Wagner , Jacob Seifert , Yukinori Taniguchi , Roger Proksch , Sonia Contera

Using Coarse-Grained Molecular Dynamics simulations, we study the relaxation of bilayer vesicles, uniaxially compressed by an Atomic Force Microscope (AFM) cantilever. The relaxation time exhibits a strong force-dependence.…

Soft Condensed Matter · Physics 2016-12-21 Ben M. Barlow , Martine Bertrand , Béla Joos

A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…

Soft Condensed Matter · Physics 2013-01-15 Phil Attard

The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…

Materials Science · Physics 2008-03-13 B. J. Rodriguez , S. Jesse , K. Seal , A. P. Baddorf , S. V. Kalinin

Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in…

Statistical Mechanics · Physics 2009-11-17 Pierdomenico Paolino , Bruno Tiribilli , Ludovic Bellon

We present a straightforward method for measuring the fluids' relative viscosity via a simple graphical analysis of the normalised position autocorrelation function of an optically trapped bead, without the need of embarking on laborious…

We demonstrate AFM imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector…

We consider the stochastic dynamics of an array of two closely spaced atomic force microscope cantilevers in a viscous fluid for use as a possible biomolecule sensor. The cantilevers are not driven externally, as is common in applications…

Mesoscale and Nanoscale Physics · Physics 2009-11-11 M. T. Clark , M. R. Paul

In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…

Instrumentation and Detectors · Physics 2015-06-16 Pierdomenico Paolino , Felipe A. Aguilar Sandoval , Ludovic Bellon
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