Related papers: A versatile simulator for specular reflectivity st…
Absorbing boundaries are frequently employed in real-time propagation of the Schr\"odinger equation to remove spurious reflections and efficiently emulate outgoing boundary conditions. These conditions are a fundamental ingredient for an…
In a recent experiment, the out-of-plane surface susceptibility of a single-layer two-dimensional atom crystal in the visible spectrum has been measured. This susceptibility gives a measurable contribution to the reflectivity of…
Since specular reflection often exists in the real captured images and causes deviation between the recorded color and intrinsic color, specular reflection separation can bring advantages to multiple applications that require consistent…
We introduce a novel reflection-mode diffraction tomography technique that enables simultaneous recovery of forward and backward scattering information for high-resolution 3D refractive index reconstruction. Our technique works by imaging a…
A spatial-frequency thin-film filter with inclusions of nanoparticles operating in the visible range of the spectrum is investigated. The effect of nanoparticles embedded in the central and lateral layers of the frustrated total internal…
Neutron reflectometry (NR) has emerged as a unique technique for the investigation of structure and magnetism of thin films of both biologically relevant and magnetic materials. The advantage of NR with respect to many other…
To take advantage of high-resolution optics sensitive to a broad energy range, future X-ray imaging instruments will require thick detectors with small pixels. This pixel aspect ratio affects spectral response in the soft X-ray band, vital…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…
Disordered heterostructures stand as a general description for compounds that are part of homologous series such as bismuth chalcogenides. In device engineering, van der Waals epitaxy of these compounds is very promising for applications in…
Accurately measuring the geometry and spatially-varying reflectance of real-world objects is a complex task due to their intricate shapes formed by concave features, hollow engravings and diverse surfaces, resulting in inter-reflection and…
SIMNRA is widely adopted by the scientific community of ion beam analysis for interpretation of nuclear scattering analysis. Taking advantage of its recognized reliability and quality of the simulations, we developed a computer program that…
Optical spectroscopy is indispensable for research and development in nanoscience and nanotechnology, microelectronics, energy, and advanced manufacturing. Advanced optical spectroscopy tools often require both specifically designed…
This paper presents a process for estimating the spatially varying surface reflectance of complex scenes observed under natural illumination. In contrast to previous methods, our process is not limited to scenes viewed under controlled…
There is widespread interest in estimating the fluorescence properties of natural materials in an image. However, the separation between reflected and fluoresced components is difficult, because it is impossible to distinguish reflected and…
We introduce a novel type of neutron interference mirrors based on a chemically homogeneous BxC (x>4) matrix with internal high precision 10B/11B isotope modulation. Simulations predict that these mirrors exhibit very high neutron…
Relativistic mirrors can be realized with strongly nonlinear Langmuir waves excited by intense laser pulses in underdense plasma. On reflection from the relativistic mirror the incident light affects the mirror motion. The corresponding…
Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under…
The structural investigations of nanomaterials motivated by their large variety and diverse set of applications have attracted considerable attention. In particular, the ever-improving machinery, both in laboratory and at large scale…
We combine two-dimensional freeform reflector design with a scattering surface modelled using microfacets, i.e., small specular surfaces representing surface roughness. The model results in a convolution integral for the scattered light…