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We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…

We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its…

Mesoscale and Nanoscale Physics · Physics 2014-10-14 Riccardo Borgani , Daniel Forchheimer , Jonas Bergqvist , Per-Anders Thorén , Olle Inganäs , David B. Haviland

Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation,…

Mesoscale and Nanoscale Physics · Physics 2013-03-12 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Modern optical nano-elements pursue ever-smaller sizes and individualized functionalities. Those elements that can efficiently manipulate the magnetic field of light boast promising future applications with a great challenge: the magnetic…

Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different…

Quantum Physics · Physics 2023-05-03 W. J. Kim , U. D. Schwarz

Atomic Force Microscope images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image…

Classical Physics · Physics 2015-05-18 Kun Han , Matteo Ciccotti , Stéphane Roux

We study theoretically the van der Waals interaction between two atoms out of equilibrium with isotropic electromagnetic field. We demonstrate that at large interatomic separations, the van der Waals forces are resonant, spatially…

Quantum Physics · Physics 2018-05-09 Yury Sherkunov

Photo-induced magnetic force between nanostructures, at optical frequencies, is investigated theoretically. Till now optical magnetic effects are not used in scanning probe microscopy because of the vanishing natural magnetism with…

A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement…

Materials Science · Physics 2007-11-06 Elisa Palacios-Lidon , Jaime Colchero

Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…

Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…

Applied Physics · Physics 2024-11-26 Kenichi Umeda , Noriyuki Kodera

We present a unique experimental configuration that allows us to determine the interfacial forces on nearly parallel plates made from the thinnest possible mechanical structures, single and few layer graphene membranes. Our approach…

The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…

In a framework for long-range density-functional theory we present a unified full-field treatment of the asymptotic van der Waals interaction for atoms, molecules, surfaces, and other objects. The only input needed consists of the electron…

Condensed Matter · Physics 2009-10-31 Erika Hult , Henrik Rydberg , Bengt I. Lundqvist , David C. Langreth

We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force…

Mesoscale and Nanoscale Physics · Physics 2013-02-08 Daniel Platz , Daniel Forchheimer , Erik A. Tholen , David B. Haviland

Optical tweezers and optical lattices are making it possible to control small particles by means of electromagnetic forces and torques. In this context, a method is presented in this work to calculate electromagnetic forces and torques for…

Other Condensed Matter · Physics 2009-11-13 F. J. Garcia de Abajo

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

Materials Science · Physics 2007-05-23 Franz-Josef Elmer

Surface wettability has a huge influence on its functional properties. For example, to minimize smudging, surfaces should be able to repel oil droplets. To quantify surface wettability, the most common approach is to measure the contact…

Soft Condensed Matter · Physics 2020-04-09 Dan Daniel , Yunita Florida , Chee Leng Lay , Xue Qi Koh , Anqi Sng , Nikodem Tomczak

Understanding the extent of contact between objects is crucial for surface-driven phenomena in the natural world. While interactions are known to occur at subnanometer-length scales, the techniques needed to measure such small-length scales…

Soft Condensed Matter · Physics 2024-02-21 Utkarsh Patil , Stephen Merriman , Shubhendu Kumar , Ali Dhinojwala

Interactions between atomic and molecular objects are to a large extent defined by the nanoscale electrostatic potentials which these objects produce. We introduce a scanning probe technique that enables three-dimensional imaging of local…

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