Related papers: How to Measure Forces when the Atomic Force Micros…
The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…
We report on the measurement of the Casimir force between conducting surfaces in a parallel configuration. The force is exerted between a silicon cantilever coated with chromium and a similar rigid surface and is detected looking at the…
Recent atomic force microscopy (AFM) can measure force curves between a probe and a sample surface in solvent. The force curve is thought as the solvation structure in some cases, because its shape is generally oscilltive and pitch of the…
It is predicted that in force microscopy the quantum fluctuations responsible for the Casimir force can be directly observed as temperature-independent force fluctuations having spectral density $9\pi/(40\ln(4/e)) \hbar \delta k$, where…
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Colloidal probes are often used in force microscopy when the geometry of the tip-sample interaction should be well controlled. Their calibration requires the understanding of their mechanical response, which is very sensitive to the details…
We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…
We propose a two-frequency driving scheme in dynamic atomic force microscopy that maximizes the interaction time between tip and sample. Using a stochastic description of the cantilever dynamics, we predict large classical squeezing and a…
We analytically derive and experimentally demonstrate a method for the simultaneous measurement of deflection for large arrays of cantilevers. The Fresnel diffraction patterns of a cantilever independently reveals tilt, curvature, cubic and…
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…
We report the details of construction and testing of a Quantum Twisting Microscope, a recently developed scanning probe instrument that enables twist angle dependent electronic measurements on layered materials. Our implementation is based…
Thermal expansion, or dilation, is closely related to the specific heat, and provides useful information regarding material properties. The accurate measurement of dilation in confined spaces coupled with other limiting experimental…
Surface wettability has a huge influence on its functional properties. For example, to minimize smudging, surfaces should be able to repel oil droplets. To quantify surface wettability, the most common approach is to measure the contact…
Quality factor plays a fundamental role in dynamic mode atomic force microscopy. We present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-P\'erot optical interferometer. The experimental…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
The thermo-electrical properties of a complex silicon cantilever structure used in thermal scanning probe lithography are modeled based on well established empirical laws for the thermal conductivity in silicon, the electrical conductivity…
Storing and accessing information in atomic-scale magnets requires magnetic imaging techniques with single-atom resolution. Here, we show simultaneous detection of the spin-polarization and exchange force, with or without the flow of…