Related papers: Automatic Detection of Texture Defects Using Textu…
We present in this paper a biometric system of face detection and recognition in color images. The face detection technique is based on skin color information and fuzzy classification. A new algorithm is proposed in order to detect…
This paper presents a CAD-based approach for automated surface defect detection. We leverage the a-priori knowledge embedded in a CAD model and integrate it with point cloud data acquired from commercially available stereo and depth…
Defect detection in the manufacturing industry is of utmost importance for product quality inspection. Recently, optical defect detection has been investigated as an anomaly detection using different deep learning methods. However, the…
Texture analysis is an important field of investigation that has received a great deal of interest from computer vision community. In this paper, we propose a novel approach for texture modeling based on partial differential equation (PDE).…
The advent of large scale multimedia databases has led to great challenges in content-based image retrieval (CBIR). Even though CBIR is considered an emerging field of research, however it constitutes a strong background for new…
Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity…
Texture synthesis is widely used in the field of computer graphics, vision, and image processing. In the present paper, a texture synthesis algorithm is proposed for near-regular natural textures with the help of a representative periodic…
In manufacturing processes, surface inspection is a key requirement for quality assessment and damage localization. Due to this, automated surface anomaly detection has become a promising area of research in various industrial inspection…
Extracting and using class-discriminative features is critical for fine-grained recognition. Existing works have demonstrated the possibility of applying deep CNNs to exploit features that distinguish similar classes. However, CNNs suffer…
The quality control of printed circuit boards (PCBs) is paramount in advancing electronic device technology. While numerous machine learning methodologies have been utilized to augment defect detection efficiency and accuracy, previous…
The analysis of defects and defect dynamics in crystalline materials is important for fundamental science and for a wide range of applied engineering. With increasing system size the analysis of molecular-dynamics simulation data becomes…
Glass fabric reinforced thermoplastic (GFRT) constitutes a class of composite materials that are especially suited for automobile construction due to their combination of low weight, ease of production and mechanical properties. However, in…
Visual inspection of industrial products is used to determine the control quality for these products. This paper deals with the problem of visual inspection of ceramic tiles industry using Wavelet Transform. The third level the coefficients…
Recent advances in the industrial inspection of textured surfaces-in the form of visual inspection-have made such inspections possible for efficient, flexible manufacturing systems. We propose an unsupervised feature memory rearrangement…
Mechanical metamaterials often exhibit pattern transformations through instabilities, enabling applications in, e.g., soft robotics, sound reduction, and biomedicine. These transformations and their resulting mechanical properties are…
Wafer defect segmentation is pivotal for semiconductor yield optimization yet remains challenged by the intrinsic conflict between microscale anomalies and highly periodic, overwhelming background textures. Existing deep learning paradigms…
We present a comprehensive approach to characterizing labyrinthine structures that often emerge as a final steady state in pattern forming systems. We employ advanced machine learning based pattern recognition techniques to identify the…
Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper…
This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the…
The importance of ultrasonic nondestructive testing has been increasing in recent years, and there are high expectations for the potential of laser ultrasonic visualization testing, which combines laser ultrasonic testing with scattered…