English
Related papers

Related papers: Application of Spectroscopic Ellipsometry and Muel…

200 papers

A new method for absolute polarimetric calibration of large telescopes is presented. The proposed method is highly accurate and is based on the calibration of a small sub-aperture, which is then extended to the full system by means of…

Astrophysics · Physics 2009-11-10 H. Socas-Navarro

In-line polarimeters perform non-destructive polarization measurements of optical signals, and play a critical role in monitoring and controlling the polarization environment in for example optical networks. While current in-line…

Optics · Physics 2015-12-10 J. P. Balthasar Müller , Kristjan Leosson , Federico Capasso

This paper describes a method for the explicit reconstruction and visualization of various polarization ellipses from the intensities measured after a rotating polarizer. The state of polarization of a light beam is represented by the…

Optics · Physics 2022-11-29 Ramonika Sengupta , Brijesh Tripathi , Asha Adhiya

Polarization is well known for its ability to decompose diffuse and specular reflections. However, the existing decomposition methods only focus on direct reflection and overlook multiple reflections, especially specular inter-reflection.…

Computer Vision and Pattern Recognition · Computer Science 2026-03-24 Ryota Maeda , Shinsaku Hiura

The vectorial evolution of polarized light interaction with a medium can reveal its microstructure and anisotropy beyond what can be obtained from scalar light interaction. Anisotropic properties (diattenuation, retardance, and…

Optics · Physics 2024-02-26 Zhineng Xie , Guowu Huang , Weihao Lin , Xin Jin , Yifan Ge , Yansen Hu , Xiafei Qian , Min Xu

Telescopes often modify the input polarization of a source so that the measured circular or linear output state of the optical signal can be signficantly different from the input. This mixing, or polarization "cross-talk", is defined by the…

Instrumentation and Methods for Astrophysics · Physics 2015-05-28 D. M. Harrington , J. R. Kuhn , S. Hall

The problem of imaging materials with circular polarization properties is discussed within the framework of vectorial ptychography. We demonstrate, both theoretically and numerically, that using linear polarizations to investigate such…

Optics · Physics 2023-10-04 Patrick Ferrand , Michel Mitov

Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully…

Graphics · Computer Science 2023-02-09 Inseung Hwang , Daniel S. Jeon , Adolfo Muñoz , Diego Gutierrez , Xin Tong , Min H. Kim

The detection and classification of microplastics in water remain a significant challenge due to their diverse properties and the limitations of traditional optical methods. Standard spectroscopic techniques often suffer from the strong…

Computer Vision and Pattern Recognition · Computer Science 2026-03-25 Leonard Saur , Marc von Pawlowski , Ulrich Gengenbach , Ingo Sieber , Hossein Shirali , Lorenz Wührl , Xiangyu Weng , Rainer Kiko , Christian Pylatiuk

Spectroscopic ellipsometry is a widely used optical technique both in industry and research for determining the optical properties and thickness of thin films. The effective use of spectroscopic ellipsometry on micro-structures is inhibited…

Optics · Physics 2023-02-28 Ralfy Kenaz , Ronen Rapaport

Singular Mueller matrices play an important role in polarization algebra and have peculiar properties that stem from the fact that either the medium exhibits maximum diattenuation and/or polarizance, or because its associated canonical…

Optics · Physics 2016-04-06 Jose J. Gil , Razvigor Ossikovski , Ignacio San Jose

Linear (spectro) polarimetry is usually performed using separate photon flux measurements after spatial or temporal polarization modulation. Such classical polarimeters are limited in sensitivity and accuracy by systematic effects and…

Optics · Physics 2010-05-28 Frans Snik , Theodora Karalidi , Christoph U. Keller

Accurate characterization of polarization dependent light matter interactions in nanostructured systems is paramount for the development of chiral metasurfaces. It is also often challenging, because multiple anisotropic mechanisms, such as…

Optics · Physics 2026-04-27 Jeeban Kumar Nayak , Ebru Buhara , Olivier J. F. Martin

We show that, under the right conditions, one can make highly accurate polarization-based measurements without knowing the absolute polarization state of the probing light field. It is shown that light, passed through a randomly varying…

The fast-growing field of soft matter research requires increasingly sophisticated tools for experimental studies. One of the oldest and most widely used tools to study soft matter systems is optical microscopy. Recent advances in optical…

Soft Condensed Matter · Physics 2011-08-17 Taewoo Lee , Bohdan Senyuk , Rahul P. Trivedi , Ivan I. Smalyukh

A precise, accurate, and relatively straightforward in-situ method to measure and control the ellipticity of light resonantly interacting with an atomic vapor is described. The technique can be used to minimize vector light shifts. The…

Optics · Physics 2017-09-14 Derek F. Jackson Kimball , Jordan Dudley , Yan Li , Dilan Patel

Mueller polarimetry is a powerful technique with broad applications in astronomy, remote sensing, advanced material analysis, and biomedical imaging. However, instrumental constraints frequently restrict the measurement to an incomplete…

We present a method based on Mueller calculus to calibrate linear polarimetric observations. The key advantages of the proposed way of calibration are: (1) that it can be implemented in a data reduction pipeline, (2) that it is possible to…

Astrophysics · Physics 2009-11-13 Franco Joos , Esther Buenzli , Hans Martin Schmid , Christian Thalmann

This study is concerned with the design of a Mueller imaging polarimeter for the visualization of spatially-varying Mueller matrix fields. A simplified calibration procedure is advocated, where all the optical elements are calibrated…

Instrumentation and Detectors · Physics 2018-11-08 Yvain Quéau , Florian Leporcq , Ayman Alfalou

An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical constants, structural profiles, etc. However, the precise…