Related papers: Study of point spread in aberration-corrected high…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the…
Point-spread function of the probe forming optics ($PSF_{optics} $) is reported for the first time in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, the electron probe information is lost as the…
We examined the anisotropic point spread function (PSF) of Suprime-Cam data utilizing dense star field data. We decomposed the PSF ellipticities into three components, the optical aberration, atmospheric turbulence, and chip-misalignment in…
In this review article fundamentals of aberration corrected phase contrast transmission electron microscopy for the structural characterization of materials at atomic length scale is presented. The word structure entails atomic arrangement…
Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…
The point spread function (PSF) of a translation invariant imaging system is its impulse response, which cannot always be measured directly. This is the case in high energy X-ray radiography, and it must be estimated from images of…
Particle Size Analysis (PSA) is an important process carried out in a number of industries, which can significantly influence the properties of the final product. A ubiquitous instrument for this purpose is the Optical Microscope (OM).…
Experiments in nuclear and particle physics often use magnetic fields to guide charged reaction products to a detector. Due to their gyration in the guide field, the particles hit the detector within an area that can be considerably larger…
The achievable instrumental performance of a scanning transmission electron microscope (STEM) is determined by the size and shape of the incident electron probe. The most important optical factor in achieving the optimum probe profile is…
Current and future imaging surveys will measure cosmic shear with a statistical precision that demands a deeper understanding of potential systematic biases in galaxy shape measurements than has been achieved to date. We investigate the…
Matter-wave interferometry plays a significant role in scientific research and technological applications. While position-momentum phase-space squeezing has been demonstrated to increase the coherence of atom sources by reducing momentum…
The quantitative characterization of the degree of randomness and aggregation of surface micro and nanostructures is critical to evaluate their effects on targeted functionalities. To this end, the methods of Point Pattern Analysis (PPA),…
X-ray cone-beam computed tomography (CT) has the notable features such as high efficiency and precision, and is widely used in the fields of medical imaging and industrial non-destructive testing, but the inherent imaging degradation…
The traditional methods of image assessment, such as mean squared error (MSE), signal-to-noise ratio (SNR), and Peak signal-to-noise ratio (PSNR), are all based on the absolute error of images. Pearson's inner-product correlation…
This Point spread function (PSF) plays a crucial role in many computational imaging applications, such as shape from focus/defocus, depth estimation, and fluorescence microscopy. However, the mathematical model of the defocus process is…
Coherence properties and wavelength of light sources are indispensable for optical coherence microscopy/tomography as they greatly influence the signal to noise ratio, axial resolution, and penetration depth of the system. In the present…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient…