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Related papers: High resolution SIMS depth profiling of nanolayers

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Aiming at developing high thermal conductivity copper/diamond composite, an unconventional approach applying self-assembled monolayer (SAM) prior to the high-temperature sintering of copper/diamond composite was utilized to enhance the…

Structured illumination microscopy (SIM) is an important super-resolution based microscopy technique that breaks the diffraction limit and enhances optical microscopy systems. With the development of biology and medical engineering, there…

Image and Video Processing · Electrical Eng. & Systems 2021-11-18 Xi Cheng , Jun Li , Qiang Dai , Zhenyong Fu , Jian Yang

Nanoscale transistors require aggressive reduction of all channel dimensions: length, width, and thickness. While monolayer two-dimensional semiconductors (2DS) offer ultimate thickness scaling, good performance has largely been achieved…

Semi-Supervised Instance Segmentation (SSIS) aims to leverage an amount of unlabeled data during training. Previous frameworks primarily utilized the RGB information of unlabeled images to generate pseudo-labels. However, such a mechanism…

Computer Vision and Pattern Recognition · Computer Science 2024-06-26 Xin Chen , Jie Hu , Xiawu Zheng , Jianghang Lin , Liujuan Cao , Rongrong Ji

Nanoscale fabrication and characterisation techniques critically underpin a vast range of fields, including materials science, nanoelectronics and nanobiotechnology. Focused ion beam (FIB) techniques are particularly appealing due to their…

The effects of ion beam induced atomic mixing and subsequent thermal treatment in Si/C multilayer structures are investigated by use of the technique of grazing incidence X-ray diffraction (GIXRD) and Raman spectroscopy. The [Si (3.0 nm) /…

Materials Science · Physics 2007-05-23 Ram Prakash , S. Amirthapandian , D. M. Phase , S. K. Deshpande , R. Kesavamoorthy , K. G. M. Nair

Helium-ion beams (HIB) focused to sub-nanometer scales have emerged as powerful tools for high-resolution imaging as well as nano-scale lithography, ion milling or deposition. Quantifying irradiation effects is essential for reliable device…

Mesoscale and Nanoscale Physics · Physics 2017-03-21 Adrian Gozar , Nicholas E. Litombe , Jennifer E. Hoffman , Ivan Bozovic

Fundamental understanding of ionic transport at the nanoscale is essential for developing biosensors based on nanopore technology and new generation high-performance nanofiltration membranes for separation and purification applications. We…

Light-weight time-of-flight (ToF) depth sensors are compact and cost-efficient, and thus widely used on mobile devices for tasks such as autofocus and obstacle detection. However, due to the sparse and noisy depth measurements, these…

Computer Vision and Pattern Recognition · Computer Science 2023-08-29 Xinyang Liu , Yijin Li , Yanbin Teng , Hujun Bao , Guofeng Zhang , Yinda Zhang , Zhaopeng Cui

We propose a new detection technique based on radio-frequency (RF) bias and readout of an antenna-coupled superconducting nanobolometer. This approach is suitable for Frequency-Division-Multiplexing (FDM) readout of large arrays using…

Instrumentation and Detectors · Physics 2014-12-16 A. A. Kuzmin , M. Merker , S. V. Shitov , N. N. Abramov , A. B. Ermakov , M. Arndt , S. H. Wuensch , K. S. Ilin , A. V. Ustinov , M Siegel

Placing a nanomechanical object in the evanescent near-field of a high-$Q$ optical microcavity gives access to strong gradient forces and quantum-noise-limited displacement readout, offering an attractive platform for precision sensing…

The noise in the depth profiles of secondary ion mass spectrometry (SIMS) is studied using different samples under various experimental conditions. Despite the noise contributions from various parts of the dynamic SIMS process, its overall…

Materials Science · Physics 2009-10-28 D. P. Chu , M. G. Dowsett , G. A. Cooke

Interfaces govern the unique mechanical response of amorphous multilayers. Here, we examine nanoindentation hardness and deformation behaviour of amorphous-amorphous Ta$_2$O$_5$/SiO$_2$ nanolaminates with bilayer thicknesses ranging from 2…

Nanometric layer thickness imaging is crucial for fundamental research and characterization of micro fabricated devices. Here, we assess the potential of a non-contact opto-acoustic frequency domain laser ultrasound (FreDomLUS) microscopy…

Instrumentation and Detectors · Physics 2025-12-02 Martin Ryzy , Guqi Yan , István Veres , Thomas Berer , Ivan Alić , Clemens Grünsteidl , Georg Watzl , Georg Gramse , Susanne Kreuzer

Intelligent metasurfaces may be harnessed for realizing efficient holographic multiple-input and multiple-output (MIMO) systems, at a low hardware-cost and high energy-efficiency. As part of this family, we propose a hybrid beamforming…

Information Theory · Computer Science 2025-02-18 Qingchao Li , Mohammed El-Hajjar , Chao Xu , Jiancheng An , Chau Yuen , Lajos Hanzo

Scanning diamond nitrogen-vacancy probe microscopy (SNVM) is an important tool for studying nanoscale condensed-matter phenomena. Ga$^+$-ion-focused-ion-beam (FIB) milling has been introduced as an available method for fabricating SNVM,…

Materials Science · Physics 2026-01-13 Dwi Prananto , Yifei Wang , Yuta Kainuma , Kunitaka Hayashi , Masahiko Tomitori , Toshu An

The combination of core/shell geometry and band gap engineering in nanowire heterostructures can be employed to realize systems with novel transport and optical properties. Here, we report on the growth of InAs/InP/GaAsSb core-dual-shell…

Materials Science · Physics 2021-02-04 Omer Arif , Valentina Zannier , Ang Li , Francesca Rossi , Daniele Ercolani , Fabio Beltram , Lucia Sorba

Understanding interlayer and intralayer coupling in two-dimensional layered materials (2DLMs) has fundamental and technological importance for their large-scale production, engineering heterostructures, and development of flexible and…

Intelligent metasurface has recently emerged as a promising technology that enables the customization of wireless environments by harnessing large numbers of low-cost reconfigurable scattering elements. However, prior studies have…

Information Theory · Computer Science 2025-05-05 Jiancheng An , Marco Di Renzo , Mérouane Debbah , H. Vincent Poor , Chau Yuen

Time-of-Flight (ToF) depth sensing camera is able to obtain depth maps at a high frame rate. However, its low resolution and sensitivity to the noise are always a concern. A popular solution is upsampling the obtained noisy low resolution…

Computer Vision and Pattern Recognition · Computer Science 2015-06-18 Wei Liu , Yijun Li , Xiaogang Chen , Jie Yang , Qiang Wu , Jingyi Yu