Related papers: State Feedback Control for Adjusting the Dynamic B…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
We describe a method for feedback-regulation of a microcantilever's response using optical radiation pressure. One laser measures the position of the cantilever and another laser applies a force that is a phase-shifted function of that…
Measurement-based control, utilizing an active feedback loop, is a standard tool in technology. Feedback control is also emerging as a useful and fundamental tool in quantum technology and in related fundamental studies, where it can be…
In this thesis I consider the general problem of how to make the best possible phase measurements using feedback. Both the optimum input state and optimum feedback are considered for both single-mode dyne measurements and two-mode…
Feedback control plays a crucial role in improving system accuracy and stability for a variety of scientific and engineering applications. Here, we theoretically and experimentally investigate the implementation of feedback control in…
Quality factor plays a fundamental role in dynamic mode atomic force microscopy. We present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-P\'erot optical interferometer. The experimental…
Shape effects in magnetic particles are widely studied, because of the ability of the shape and the size to control the parameters of a sample during its production. Experiments with nano-sized samples show that the shape can affect also…
We propose a non-standard spectroscopic technique that uses a feedback control of the input probe field parameters to significantly increase the contrast and quality factor of the atomic resonances. In particular, to apply this technique…
A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as…
We demonstrate that the method of characterizing viscoelastic materials with Atomic Force Microscopy (AFM) by fitting analytical models to force-distance (FD) curves often yields conflicting and physically unrealistic results. Because this…
Phase Coded (PC) waveforms possess desirable Auto-Correlation Function (ACF) properties for use in radar and sonar systems. However, their spectra possess high spectral leakage due to the abrupt phase transitions between the chips in the…
We propose a simple feedback-control scheme for adiabatic quantum computation with superconducting flux qubits. The proposed method makes use of existing on-chip hardware to monitor the ground-state curvature, which is then used to control…
Backaction-evading (BAE) measurements of a mechanical resonator, by continuously monitoring a single quadrature of motion, can achieve precision below the zero-point uncertainty. When this happens, the measurement leaves the resonator in a…
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…
A fundamental parameter to determine how electromagnetic waves interfere is their relative phase. Therefore, achieving a fine control over it enables a wide range of interferometric applications. Existing phase control methods rely on…
We revisit the problem of preparing a mechanical oscillator in the vicinity of its quantum-mechanical ground state by means of feedback cooling based on continuous optical detection of the oscillator position. In the parameter regime…
A new method for examining the possible space-time variation of the fine structure constant ($\alpha$) is proposed. The technique uses a relatively simple measurement with an optical resonator to compare atom-stabilized optical frequency…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Transmit beamforming is a simple multi-antenna technique for increasing throughput and the transmission range of a wireless communication system. The required feedback of channel state information (CSI) can potentially result in excessive…