Related papers: Robust Repetitive Controller for Fast AFM Imaging
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Purpose: To propose an alternating learning approach to learn the sampling pattern (SP) and the parameters of variational networks (VN) in accelerated parallel magnetic resonance imaging (MRI). Methods: The approach alternates between…
Small animal PET scanners require high spatial resolution and good sensitivity. To reconstruct high-resolution images in 3D-PET, iterative methods, such as OSEM, are superior to analytical reconstruction algorithms, although their high…
This paper applies the Recursive Projection Method (RPM) to the problem of finding the effective mechanical response of a periodic heterogeneous solid. Previous works apply the Fast Fourier Transform (FFT) in combination with various…
The Probe-Particle Model combine theories designed for the simulation of scanning probe microscopy experiments, employing non-reactive, flexible tip apices to achieve sub-molecular resolution. In the article we present the latest version of…
Multiphoton microscopy (MPM) has gained enormous popularity over the years for its capacity to provide high resolution images from deep within scattering samples1. However, MPM is generally based on single-point laser-focus scanning, which…
Reinforcement Learning (RL) has recently impressed the world with stunning results in various applications. While the potential of RL is now well-established, many critical aspects still need to be tackled, including safety and stability…
As mechanical devices in the nano/micro length scale are increasingly employed, it is crucial to understand nanoscale friction and wear especially at technically relevant sliding velocities. Accordingly, a novel technique has been developed…
Model predictive control (MPC) is increasingly being considered for control of fast systems and embedded applications. However, the MPC has some significant challenges for such systems. Its high computational complexity results in high…
The problem of an accurate tip radius and shape characterization is very important for determination of surface mechanical and chemical properties on the basis of the scanning probe microscopy measurements. We think that the most favorable…
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on the sample is tedious. This is an important limitation of many…
This study presents a practical and dose-efficient strategy for resolution enhancement in planar radiography, based on mechanically supersampled acquisition with high-Z photon-counting detectors (PCDs). Unlike prior event-based or cluster…
Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…
Feature compression is increasingly important for improving the efficiency of downstream tasks, especially in applications involving large-scale or multi-modal data. While existing methods typically rely on dedicated models for achieving…
Metasurfaces (MSs) have recently become an efficient solution for controlling a spatial field distribution according to the demand of an electromagnetic device. In particular, anomalous reflectors based on impenetrable MSs can be realized…
Accelerating magnetic resonance image (MRI) reconstruction process is a challenging ill-posed inverse problem due to the excessive under-sampling operation in k-space. In this paper, we propose a recurrent transformer model, namely…
In the practical industry, the most commonly used application of statistical analysis for monitoring the process mean is the control chart. Control charts are generated based on the presumption that we have a sample from a stable process.…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
We report on our progress in the development of an atomic magnetometer (AM) based low-frequency magnetic particle imaging (MPI) scanner, expected to be free from Specific Absorption Rate (SAR) and Peripheral Nerve Stimulation (PNS)…